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Title: Finite size effects in ferroelectric-semiconductor thin films under open-circuit electric boundary conditions

Abstract

General features of finite size effects in the ferroelectric-semiconductor film under open-circuit electric boundary conditions are analyzed using Landau-Ginzburg-Devonshire theory and continuum media electrostatics. The temperature dependence of the film critical thickness, spontaneous polarization and depolarization field profiles of the open-circuited films are found to be significantly different from the characteristics of short-circuited ones. In particular, we predict the re-entrant type transition boundary between the mono-domain and poly-domain ferroelectric states due to reduced internal screening efficiency and analyzed possible experimental scenarios created by this mechanism. Performed analysis is relevant for the quantitative description of free-standing ferroelectric films phase diagrams and polar properties. Also our results can be useful for the explanation of the scanning-probe microscopy experiments on free ferroelectric surfaces.

Authors:
 [1]; ORCiD logo [2];  [3]
  1. NAS of Ukraine, Kyiv (Ukraine). Inst. of Problems for Material Sciences
  2. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Science (CNMS)
  3. NAS of Ukraine, Kyiv (Ukraine). Inst. of Physics
Publication Date:
Research Org.:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1265460
Grant/Contract Number:  
AC05-00OR22725
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 117; Journal Issue: 3; Journal ID: ISSN 0021-8979
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS

Citation Formats

Eliseev, Eugene A., Kalinin, Sergei V., and Morozovska, Anna N. Finite size effects in ferroelectric-semiconductor thin films under open-circuit electric boundary conditions. United States: N. p., 2015. Web. doi:10.1063/1.4906139.
Eliseev, Eugene A., Kalinin, Sergei V., & Morozovska, Anna N. Finite size effects in ferroelectric-semiconductor thin films under open-circuit electric boundary conditions. United States. doi:10.1063/1.4906139.
Eliseev, Eugene A., Kalinin, Sergei V., and Morozovska, Anna N. Wed . "Finite size effects in ferroelectric-semiconductor thin films under open-circuit electric boundary conditions". United States. doi:10.1063/1.4906139. https://www.osti.gov/servlets/purl/1265460.
@article{osti_1265460,
title = {Finite size effects in ferroelectric-semiconductor thin films under open-circuit electric boundary conditions},
author = {Eliseev, Eugene A. and Kalinin, Sergei V. and Morozovska, Anna N.},
abstractNote = {General features of finite size effects in the ferroelectric-semiconductor film under open-circuit electric boundary conditions are analyzed using Landau-Ginzburg-Devonshire theory and continuum media electrostatics. The temperature dependence of the film critical thickness, spontaneous polarization and depolarization field profiles of the open-circuited films are found to be significantly different from the characteristics of short-circuited ones. In particular, we predict the re-entrant type transition boundary between the mono-domain and poly-domain ferroelectric states due to reduced internal screening efficiency and analyzed possible experimental scenarios created by this mechanism. Performed analysis is relevant for the quantitative description of free-standing ferroelectric films phase diagrams and polar properties. Also our results can be useful for the explanation of the scanning-probe microscopy experiments on free ferroelectric surfaces.},
doi = {10.1063/1.4906139},
journal = {Journal of Applied Physics},
number = 3,
volume = 117,
place = {United States},
year = {Wed Jan 21 00:00:00 EST 2015},
month = {Wed Jan 21 00:00:00 EST 2015}
}

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Cited by: 8 works
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Works referenced in this record:

Two-dimensional ferroelectric films
journal, February 1998

  • Bune, A. V.; Fridkin, V. M.; Ducharme, Stephen
  • Nature, Vol. 391, Issue 6670, p. 874-877
  • DOI: 10.1038/36069

Critical thickness for ferroelectricity in perovskite ultrathin films
journal, April 2003

  • Junquera, Javier; Ghosez, Philippe
  • Nature, Vol. 422, Issue 6931, p. 506-509
  • DOI: 10.1038/nature01501