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Title: Band Excitation Kelvin probe force microscopy utilizing photothermal excitation

Abstract

A multifrequency open loop Kelvin probe force microscopy (KPFM) approach utilizing photothermal as opposed to electrical excitation is developed. Photothermal band excitation (PthBE)-KPFM is implemented here in a grid mode on a model test sample comprising a metal-insulator junction with local charge-patterned regions. Unlike the previously described open loop BE-KPFM, which relies on capacitive actuation of the cantilever, photothermal actuation is shown to be highly sensitive to the electrostatic force gradient even at biases close to the contact potential difference (CPD). PthBE-KPFM is further shown to provide a more localized measurement of true CPD in comparison to the gold standard ambient KPFM approach, amplitude modulated KPFM. In conclusion, PthBE-KPFM data contain information relating to local dielectric properties and electronic dissipation between tip and sample unattainable using conventional single frequency KPFM approaches.

Authors:
 [1];  [2];  [2];  [1];  [2];  [2]
  1. University College Dublin, Belfield, Dublin (Ireland)
  2. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Science (CNMS)
Publication Date:
Research Org.:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1265398
Grant/Contract Number:
AC05-00OR22725
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 106; Journal Issue: 10; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Collins, Liam, Jesse, Stephen, Balke, Nina, Rodriguez, Brian J., Kalinin, Sergei, and Li, Qian. Band Excitation Kelvin probe force microscopy utilizing photothermal excitation. United States: N. p., 2015. Web. doi:10.1063/1.4913910.
Collins, Liam, Jesse, Stephen, Balke, Nina, Rodriguez, Brian J., Kalinin, Sergei, & Li, Qian. Band Excitation Kelvin probe force microscopy utilizing photothermal excitation. United States. doi:10.1063/1.4913910.
Collins, Liam, Jesse, Stephen, Balke, Nina, Rodriguez, Brian J., Kalinin, Sergei, and Li, Qian. Fri . "Band Excitation Kelvin probe force microscopy utilizing photothermal excitation". United States. doi:10.1063/1.4913910. https://www.osti.gov/servlets/purl/1265398.
@article{osti_1265398,
title = {Band Excitation Kelvin probe force microscopy utilizing photothermal excitation},
author = {Collins, Liam and Jesse, Stephen and Balke, Nina and Rodriguez, Brian J. and Kalinin, Sergei and Li, Qian},
abstractNote = {A multifrequency open loop Kelvin probe force microscopy (KPFM) approach utilizing photothermal as opposed to electrical excitation is developed. Photothermal band excitation (PthBE)-KPFM is implemented here in a grid mode on a model test sample comprising a metal-insulator junction with local charge-patterned regions. Unlike the previously described open loop BE-KPFM, which relies on capacitive actuation of the cantilever, photothermal actuation is shown to be highly sensitive to the electrostatic force gradient even at biases close to the contact potential difference (CPD). PthBE-KPFM is further shown to provide a more localized measurement of true CPD in comparison to the gold standard ambient KPFM approach, amplitude modulated KPFM. In conclusion, PthBE-KPFM data contain information relating to local dielectric properties and electronic dissipation between tip and sample unattainable using conventional single frequency KPFM approaches.},
doi = {10.1063/1.4913910},
journal = {Applied Physics Letters},
number = 10,
volume = 106,
place = {United States},
year = {Fri Mar 13 00:00:00 EDT 2015},
month = {Fri Mar 13 00:00:00 EDT 2015}
}

Journal Article:
Free Publicly Available Full Text
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Cited by: 5 works
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