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Title: Addressing Angular Single-Event Effects in the Estimation of On-Orbit Error Rates.

Abstract

Abstract not provided.

Authors:
; ;
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1262954
Report Number(s):
SAND2015-5557C
594879
DOE Contract Number:
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the Nuclear and Space Radiation Effects Conference held July 14-17, 2015 in Boston, MA.
Country of Publication:
United States
Language:
English

Citation Formats

Lee, David S., Swift, Gary, and Wirthlin, Michael. Addressing Angular Single-Event Effects in the Estimation of On-Orbit Error Rates.. United States: N. p., 2015. Web.
Lee, David S., Swift, Gary, & Wirthlin, Michael. Addressing Angular Single-Event Effects in the Estimation of On-Orbit Error Rates.. United States.
Lee, David S., Swift, Gary, and Wirthlin, Michael. Wed . "Addressing Angular Single-Event Effects in the Estimation of On-Orbit Error Rates.". United States. doi:. https://www.osti.gov/servlets/purl/1262954.
@article{osti_1262954,
title = {Addressing Angular Single-Event Effects in the Estimation of On-Orbit Error Rates.},
author = {Lee, David S. and Swift, Gary and Wirthlin, Michael},
abstractNote = {Abstract not provided.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Wed Jul 01 00:00:00 EDT 2015},
month = {Wed Jul 01 00:00:00 EDT 2015}
}

Conference:
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  • Our study describes complications introduced by angular direct ionization events on space error rate predictions. In particular, prevalence of multiple-cell upsets and a breakdown in the application of effective linear energy transfer in modern-scale devices can skew error rates approximated from currently available estimation models. Moreover, this paper highlights the importance of angular testing and proposes a methodology to extend existing error estimation tools to properly consider angular strikes in modern-scale devices. Finally, these techniques are illustrated with test data provided from a modern 28 nm SRAM-based device.
  • In an experiment aboard the Hughes Corporation Leasat vehicle at geosynchronous orbit, single event upsets (SEU) have been continuously monitored in a memory consisting of 93L422 RAMs. Using simultaneous measurements of the high energy galactic cosmic ray and solar flare particle environment from The University of Chicago experiment aboard the IMP-8 satellite, together with a Leasat mass distribution model and ground test measurements of the SEU susceptibility for the 93L422, accurate estimates of the SEU rate are calculated based on several improvements to the standard methods. These results are discussed and compared to the Leasat flight observations.
  • Abstract not provided.
  • In an experiment aboard three Leasat vehicles at geosynchronous orbit, single-event upsets (SEU) were continuously monitored in a memory consisting of 93L422 RAMs. Using simultaneous measurements of the high-energy galactic cosmic-ray and solar-flare particle environment from the experiments aboard the IMP-8 satellite, together with at Least mass distribution model and ground test measurements of the SEU susceptibility for the 93L422, accurate estimates of the SEU rate are calculated based on several improvements to the standard methods. These results are discussed and compared to the Leasat flight observations.
  • The results are given of the first SEU measurements ever reported on IC devices with on-chip error correction. This method of SEU abatement could revolutionize the design of SEU-immune electronic systems.