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Title: Parameterization of Ion Channeling Half-Angles and Minimum Yields.

Abstract

Abstract not provided.

Authors:
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1262944
Report Number(s):
SAND2015-5543C
594866
DOE Contract Number:
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the 22nd International Conference on Ion Beam Analysis held June 14-19, 2015 in Opatija, Croatia.
Country of Publication:
United States
Language:
English

Citation Formats

Doyle, Barney Lee. Parameterization of Ion Channeling Half-Angles and Minimum Yields.. United States: N. p., 2015. Web.
Doyle, Barney Lee. Parameterization of Ion Channeling Half-Angles and Minimum Yields.. United States.
Doyle, Barney Lee. Wed . "Parameterization of Ion Channeling Half-Angles and Minimum Yields.". United States. doi:. https://www.osti.gov/servlets/purl/1262944.
@article{osti_1262944,
title = {Parameterization of Ion Channeling Half-Angles and Minimum Yields.},
author = {Doyle, Barney Lee},
abstractNote = {Abstract not provided.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Wed Jul 01 00:00:00 EDT 2015},
month = {Wed Jul 01 00:00:00 EDT 2015}
}

Conference:
Other availability
Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that hold this conference proceeding.

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  • From annual conference on nuclear and space radiation effects; Logan, UT (23 Jul 1973). X-ray generated photoemission from thin metal foils backed by graphite was measured with radiation incident from the front and back sides at several angles. irradiation was provided by a 100-kV x-ray tube with three different filters to harden the spectrum. The 2 pi photoelectron emission current from a surface was measured; a biased grid retarded the low-energy secondary electrons, which added only 10-30% to the current at zero grid bias. Investigated metals were: Mg, Al, Ti, Fe, Cu, Ag, Ta, Au, and Pb; also the totalmore » emission from just the graphite support was measured. The front-to-back ratio of emission currents at normal incidence ranged from about 1.9 for Al and Mg down to about 1.1 for Ta. The photoelectron yield was found to be G/sub e/ mu /sub a/ S/ sub e/ electrons/p hoton where mu /sub a/ and S/sub e/ are the energy-dependent photon absorption cross section and computed electron mean path length in the emitter, and G/sub e/ is a constant assumed independent of photon energy in the range studied (but does depend on radiation angle of incidence). For the photon energy range of 20-70 keV, the measured emission current densities corresponded to the following average values for G/sub e/: 0.37 plus or minus 0.06 for C, 0.30 plus or minus 0.03 for Al, 0.21 plus or minus 0.02 for Cu and Ag, and 0.18 plus or minus 0.02 for Ta. (auth)« less
  • Recently, ion implantation has been used to produce metastable alloy layers with a range of structures from crystalline substitutional solid solutions to amorphous. The technique offers the possibility of producing metastable metal layers with unique physical properties. Its application in the formation of alloys exhibiting different although complementary types of metastability is described. The metal combinations chosen (Ag-Cu and Ta-Cu) show little mutual solubility under equilibrium conditions.