Link between hopping models and percolation scaling laws for charge transport in mixtures of small molecules

Ha, Dong -Gwang; Kim, Jang -Joo; Baldo, Marc A.

doi:10.1063/1.4948591

Title: Link between hopping models and percolation scaling laws for charge transport in mixtures of small molecules

Journal Article · Fri Apr 29 00:00:00 EDT 2016 · AIP Advances

DOI:https://doi.org/10.1063/1.4948591· OSTI ID:1262288

Ha, Dong -Gwang ^[1]; Kim, Jang -Joo ^[2]; Baldo, Marc A. ^[1]

Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)
Seoul National Univ., Seoul (Korea)

Mixed host compositions that combine charge transport materials with luminescent dyes offer superior control over exciton formation and charge transport in organic light emitting devices (OLEDs). Two approaches are typically used to optimize the fraction of charge transport materials in a mixed host composition: either an empirical percolative model, or a hopping transport model. We show that these two commonly-employed models are linked by an analytic expression which relates the localization length to the percolation threshold and critical exponent. The relation is confirmed both numerically and experimentally through measurements of the relative conductivity of Tris(4-carbazoyl-9-ylphenyl) amine (TCTA) :1,3-bis(3,5-dipyrid-3-yl-phenyl) benzene (BmPyPb) mixtures with different concentrations, where the TCTA plays a role as hole conductor and the BmPyPb as hole insulator. Furthermore, the analytic relation may allow the rational design of mixed layers of small molecules for high-performance OLEDs.

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Research Organization:: Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States); Energy Frontier Research Centers (EFRC) (United States). Center for Excitonics (CE)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES); Kwanjeong Educational Foundation; National Research Foundation of Korea (NRF)

Grant/Contract Number:: SC0001088

OSTI ID:: 1262288

Journal Information:: AIP Advances, Vol. 6, Issue 4; ISSN 2158-3226

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 8 works

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