The effect of humidity on reverse breakdown in 3D silicon sensors
- Authors:
- Publication Date:
- Research Org.:
- SLAC National Accelerator Lab., Menlo Park, CA (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1261206
- DOE Contract Number:
- AC02-76SF0051
- Resource Type:
- Journal Article
- Journal Name:
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Additional Journal Information:
- Journal Volume: 785; Journal Issue: C; Journal ID: ISSN 0168-9002
- Country of Publication:
- United States
- Language:
- English
Citation Formats
McDuff, H., Hoeferkamp, M. R., Seidel, S., Wang, R., Kenney, C. J., Hasi, J., and Parker, S. I. The effect of humidity on reverse breakdown in 3D silicon sensors. United States: N. p., 2015.
Web. doi:10.1016/j.nima.2015.02.056.
McDuff, H., Hoeferkamp, M. R., Seidel, S., Wang, R., Kenney, C. J., Hasi, J., & Parker, S. I. The effect of humidity on reverse breakdown in 3D silicon sensors. United States. https://doi.org/10.1016/j.nima.2015.02.056
McDuff, H., Hoeferkamp, M. R., Seidel, S., Wang, R., Kenney, C. J., Hasi, J., and Parker, S. I. 2015.
"The effect of humidity on reverse breakdown in 3D silicon sensors". United States. https://doi.org/10.1016/j.nima.2015.02.056.
@article{osti_1261206,
title = {The effect of humidity on reverse breakdown in 3D silicon sensors},
author = {McDuff, H. and Hoeferkamp, M. R. and Seidel, S. and Wang, R. and Kenney, C. J. and Hasi, J. and Parker, S. I.},
abstractNote = {},
doi = {10.1016/j.nima.2015.02.056},
url = {https://www.osti.gov/biblio/1261206},
journal = {Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment},
issn = {0168-9002},
number = C,
volume = 785,
place = {United States},
year = {Mon Jun 01 00:00:00 EDT 2015},
month = {Mon Jun 01 00:00:00 EDT 2015}
}
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