Talbot-Lau X-ray Deflectometer electron density diagnostic for laser and pulsed power high energy density plasma experiments
Abstract
Talbot-Lau X-ray Deflectometry has been developed as an electron density diagnostic for High Energy Density plasmas. The technique can deliver x-ray refraction, attenuation, elemental composition, and scatter information from a single Moiré image. An 8 keV Talbot-Lau interferometer was deployed using laser and x-pinch backlighters. Grating survival and electron density mapping was demonstrated for 25-29 J, 8-30 ps laser pulses using copper foil targets. Moire pattern formation and grating survival was also observed using a copper x-pinch driven at 400 kA, ~1 kA/ns. Lastly, these results demonstrate the potential of TXD as an electron density diagnostic for HED plasmas.
- Authors:
-
- Johns Hopkins Univ., Baltimore, MD (United States)
- Univ. of Rochester, Rochester, NY (United States)
- Univ. of Michigan, Ann Arbor, MI (United States)
- Pontificia Univ. Catolica de Chile, Santiago (Chile)
- Publication Date:
- Research Org.:
- Johns Hopkins Univ., Baltimore, MD (United States)
- Sponsoring Org.:
- USDOE National Nuclear Security Administration (NNSA)
- OSTI Identifier:
- 1258592
- Grant/Contract Number:
- NA0002955
- Resource Type:
- Journal Article: Accepted Manuscript
- Journal Name:
- IEEE Transactions on Plasma Science
- Additional Journal Information:
- Journal Name: IEEE Transactions on Plasma Science; Journal ID: ISSN 0093-3813
- Publisher:
- IEEE
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 70 PLASMA PHYSICS AND FUSION TECHNOLOGY; X-ray imaging; refraction diagnostics; High-energy (HED) diagnostic
Citation Formats
Valdivia, M. P., Stutman, D., Stoeckl, C., Mileham, C., Begishev, I., Theobald, W., Bromage, J., Regan, S. P., Klein, S. R., Munoz-Cordoves, G., Vescovi, M., Valenzuela-Villaseca, V., and Veloso, F. Talbot-Lau X-ray Deflectometer electron density diagnostic for laser and pulsed power high energy density plasma experiments. United States: N. p., 2016.
Web. doi:10.1109/TPS.2016.2552038.
Valdivia, M. P., Stutman, D., Stoeckl, C., Mileham, C., Begishev, I., Theobald, W., Bromage, J., Regan, S. P., Klein, S. R., Munoz-Cordoves, G., Vescovi, M., Valenzuela-Villaseca, V., & Veloso, F. Talbot-Lau X-ray Deflectometer electron density diagnostic for laser and pulsed power high energy density plasma experiments. United States. https://doi.org/10.1109/TPS.2016.2552038
Valdivia, M. P., Stutman, D., Stoeckl, C., Mileham, C., Begishev, I., Theobald, W., Bromage, J., Regan, S. P., Klein, S. R., Munoz-Cordoves, G., Vescovi, M., Valenzuela-Villaseca, V., and Veloso, F. 2016.
"Talbot-Lau X-ray Deflectometer electron density diagnostic for laser and pulsed power high energy density plasma experiments". United States. https://doi.org/10.1109/TPS.2016.2552038. https://www.osti.gov/servlets/purl/1258592.
@article{osti_1258592,
title = {Talbot-Lau X-ray Deflectometer electron density diagnostic for laser and pulsed power high energy density plasma experiments},
author = {Valdivia, M. P. and Stutman, D. and Stoeckl, C. and Mileham, C. and Begishev, I. and Theobald, W. and Bromage, J. and Regan, S. P. and Klein, S. R. and Munoz-Cordoves, G. and Vescovi, M. and Valenzuela-Villaseca, V. and Veloso, F.},
abstractNote = {Talbot-Lau X-ray Deflectometry has been developed as an electron density diagnostic for High Energy Density plasmas. The technique can deliver x-ray refraction, attenuation, elemental composition, and scatter information from a single Moiré image. An 8 keV Talbot-Lau interferometer was deployed using laser and x-pinch backlighters. Grating survival and electron density mapping was demonstrated for 25-29 J, 8-30 ps laser pulses using copper foil targets. Moire pattern formation and grating survival was also observed using a copper x-pinch driven at 400 kA, ~1 kA/ns. Lastly, these results demonstrate the potential of TXD as an electron density diagnostic for HED plasmas.},
doi = {10.1109/TPS.2016.2552038},
url = {https://www.osti.gov/biblio/1258592},
journal = {IEEE Transactions on Plasma Science},
issn = {0093-3813},
number = ,
volume = ,
place = {United States},
year = {Thu Apr 21 00:00:00 EDT 2016},
month = {Thu Apr 21 00:00:00 EDT 2016}
}
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Works referencing / citing this record:
Talbot–Lau x-ray deflectometry phase-retrieval methods for electron density diagnostics in high-energy density experiments
journal, January 2018
- Valdivia, Maria Pia; Stutman, Dan; Stoeckl, Christian
- Applied Optics, Vol. 57, Issue 2