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Title: High-speed multiframe dynamic transmission electron microscope image acquisition system with arbitrary timing

Abstract

An electron microscope is disclosed which has a laser-driven photocathode and an arbitrary waveform generator (AWG) laser system ("laser"). The laser produces a train of temporally-shaped laser pulses of a predefined pulse duration and waveform, and directs the laser pulses to the laser-driven photocathode to produce a train of electron pulses. An image sensor is used along with a deflector subsystem. The deflector subsystem is arranged downstream of the target but upstream of the image sensor, and has two pairs of plates arranged perpendicular to one another. A control system controls the laser and a plurality of switching components synchronized with the laser, to independently control excitation of each one of the deflector plates. This allows each electron pulse to be directed to a different portion of the image sensor, as well as to be provided with an independently set duration and independently set inter-pulse spacings.

Inventors:
; ; ; ;
Publication Date:
Research Org.:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1258006
Patent Number(s):
9,373,479
Application Number:
14/851,692
Assignee:
Lawrence Livermore National Security, LLC (Livermore, CA) LLNL
DOE Contract Number:
AC52-07NA27344
Resource Type:
Patent
Resource Relation:
Patent File Date: 2015 Sep 11
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; 36 MATERIALS SCIENCE

Citation Formats

Reed, Bryan W., Dehope, William J, Huete, Glenn, LaGrange, Thomas B., and Shuttlesworth, Richard M. High-speed multiframe dynamic transmission electron microscope image acquisition system with arbitrary timing. United States: N. p., 2016. Web.
Reed, Bryan W., Dehope, William J, Huete, Glenn, LaGrange, Thomas B., & Shuttlesworth, Richard M. High-speed multiframe dynamic transmission electron microscope image acquisition system with arbitrary timing. United States.
Reed, Bryan W., Dehope, William J, Huete, Glenn, LaGrange, Thomas B., and Shuttlesworth, Richard M. 2016. "High-speed multiframe dynamic transmission electron microscope image acquisition system with arbitrary timing". United States. doi:. https://www.osti.gov/servlets/purl/1258006.
@article{osti_1258006,
title = {High-speed multiframe dynamic transmission electron microscope image acquisition system with arbitrary timing},
author = {Reed, Bryan W. and Dehope, William J and Huete, Glenn and LaGrange, Thomas B. and Shuttlesworth, Richard M},
abstractNote = {An electron microscope is disclosed which has a laser-driven photocathode and an arbitrary waveform generator (AWG) laser system ("laser"). The laser produces a train of temporally-shaped laser pulses of a predefined pulse duration and waveform, and directs the laser pulses to the laser-driven photocathode to produce a train of electron pulses. An image sensor is used along with a deflector subsystem. The deflector subsystem is arranged downstream of the target but upstream of the image sensor, and has two pairs of plates arranged perpendicular to one another. A control system controls the laser and a plurality of switching components synchronized with the laser, to independently control excitation of each one of the deflector plates. This allows each electron pulse to be directed to a different portion of the image sensor, as well as to be provided with an independently set duration and independently set inter-pulse spacings.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = 2016,
month = 6
}

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  • An electron microscope is disclosed which has a laser-driven photocathode and an arbitrary waveform generator (AWG) laser system ("laser"). The laser produces a train of temporally-shaped laser pulses of a predefined pulse duration and waveform, and directs the laser pulses to the laser-driven photocathode to produce a train of electron pulses. An image sensor is used along with a deflector subsystem. The deflector subsystem is arranged downstream of the target but upstream of the image sensor, and has two pairs of plates arranged perpendicular to one another. A control system controls the laser and a plurality of switching components synchronizedmore » with the laser, to independently control excitation of each one of the deflector plates. This allows each electron pulse to be directed to a different portion of the image sensor, as well as to be provided with an independently set duration and independently set inter-pulse spacings.« less
  • An electron microscope is disclosed which has a laser-driven photocathode and an arbitrary waveform generator (AWG) laser system ("laser"). The laser produces a train of temporally-shaped laser pulses each being of a programmable pulse duration, and directs the laser pulses to the laser-driven photocathode to produce a train of electron pulses. An image sensor is used along with a deflector subsystem. The deflector subsystem is arranged downstream of the target but upstream of the image sensor, and has a plurality of plates. A control system having a digital sequencer controls the laser and a plurality of switching components, synchronized withmore » the laser, to independently control excitation of each one of the deflector plates. This allows each electron pulse to be directed to a different portion of the image sensor, as well as to enable programmable pulse durations and programmable inter-pulse spacings.« less
  • A confocal scanning transmission electron microscope which includes an electron illumination device providing an incident electron beam propagating in a direction defining a propagation axis, and a precision specimen scanning stage positioned along the propagation axis and movable in at least one direction transverse to the propagation axis. The precision specimen scanning stage is configured for positioning a specimen relative to the incident electron beam. A projector lens receives a transmitted electron beam transmitted through at least part of the specimen and focuses this transmitted beam onto an image plane, where the transmitted beam results from the specimen being illuminatedmore » by the incident electron beam. A detection system is placed approximately in the image plane.« less
  • A measuring system includes an input that emulates a bandpass filter with no signal reflections. A directional coupler connected to the input passes the filtered input to electrically isolated measuring circuits. Each of the measuring circuits includes an amplifier that amplifies the signal through logarithmic functions. The output of the measuring system is an accurate high dynamic range measurement.
  • The aim of this study is to visualize the coronary artery with the intravenus injection of contrast media. We propose a method of rapid and successive acquisition of two-dimensional images in a digital processing system which uses a pair of video cameras, a shutter operation, and a beam-splitting apparatus. A prototype of the high-speed acquisition system was constructed. The two-monochromatic video-camera method was very suitable for quick acquisition. Electro-optical shutters (PLZT) were found practical with respect to the dynamic range and response time. The field blanking method was essential for the data acquisition.