skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: High-speed multiframe dynamic transmission electron microscope image acquisition system with arbitrary timing

Abstract

An electron microscope is disclosed which has a laser-driven photocathode and an arbitrary waveform generator (AWG) laser system ("laser"). The laser produces a train of temporally-shaped laser pulses of a predefined pulse duration and waveform, and directs the laser pulses to the laser-driven photocathode to produce a train of electron pulses. An image sensor is used along with a deflector subsystem. The deflector subsystem is arranged downstream of the target but upstream of the image sensor, and has two pairs of plates arranged perpendicular to one another. A control system controls the laser and a plurality of switching components synchronized with the laser, to independently control excitation of each one of the deflector plates. This allows each electron pulse to be directed to a different portion of the image sensor, as well as to be provided with an independently set duration and independently set inter-pulse spacings.

Inventors:
; ; ; ;
Publication Date:
Research Org.:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1258006
Patent Number(s):
9,373,479
Application Number:
14/851,692
Assignee:
Lawrence Livermore National Security, LLC (Livermore, CA) LLNL
DOE Contract Number:  
AC52-07NA27344
Resource Type:
Patent
Resource Relation:
Patent File Date: 2015 Sep 11
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; 36 MATERIALS SCIENCE

Citation Formats

Reed, Bryan W., Dehope, William J, Huete, Glenn, LaGrange, Thomas B., and Shuttlesworth, Richard M. High-speed multiframe dynamic transmission electron microscope image acquisition system with arbitrary timing. United States: N. p., 2016. Web.
Reed, Bryan W., Dehope, William J, Huete, Glenn, LaGrange, Thomas B., & Shuttlesworth, Richard M. High-speed multiframe dynamic transmission electron microscope image acquisition system with arbitrary timing. United States.
Reed, Bryan W., Dehope, William J, Huete, Glenn, LaGrange, Thomas B., and Shuttlesworth, Richard M. Tue . "High-speed multiframe dynamic transmission electron microscope image acquisition system with arbitrary timing". United States. doi:. https://www.osti.gov/servlets/purl/1258006.
@article{osti_1258006,
title = {High-speed multiframe dynamic transmission electron microscope image acquisition system with arbitrary timing},
author = {Reed, Bryan W. and Dehope, William J and Huete, Glenn and LaGrange, Thomas B. and Shuttlesworth, Richard M},
abstractNote = {An electron microscope is disclosed which has a laser-driven photocathode and an arbitrary waveform generator (AWG) laser system ("laser"). The laser produces a train of temporally-shaped laser pulses of a predefined pulse duration and waveform, and directs the laser pulses to the laser-driven photocathode to produce a train of electron pulses. An image sensor is used along with a deflector subsystem. The deflector subsystem is arranged downstream of the target but upstream of the image sensor, and has two pairs of plates arranged perpendicular to one another. A control system controls the laser and a plurality of switching components synchronized with the laser, to independently control excitation of each one of the deflector plates. This allows each electron pulse to be directed to a different portion of the image sensor, as well as to be provided with an independently set duration and independently set inter-pulse spacings.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Jun 21 00:00:00 EDT 2016},
month = {Tue Jun 21 00:00:00 EDT 2016}
}

Patent:

Save / Share:

Works referenced in this record:

4D ultrafast electron microscopy: Imaging of atomic motions, acoustic resonances, and moiré fringe dynamics
journal, December 2009


Approaches for ultrafast imaging of transient materials processes in the transmission electron microscope
journal, November 2012


Nanosecond time-resolved investigations using the in situ of dynamic transmission electron microscope (DTEM)
journal, October 2008