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Title: Probing Nanoscale Objects in Liquids through Membranes with Near-Field Microwave Microscopy

 [1];  [2]
  1. ORNL
  2. National Institute of Standards and Technology (NIST), Gaithersburg, MD
Publication Date:
Research Org.:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
DOE Contract Number:
Resource Type:
Resource Relation:
Conference: 45th European Microwave Conference, Paris, France, 20150906, 20150906
Country of Publication:
United States

Citation Formats

Tselev, Alexander, and Kolmakov, Andrei. Probing Nanoscale Objects in Liquids through Membranes with Near-Field Microwave Microscopy. United States: N. p., 2015. Web.
Tselev, Alexander, & Kolmakov, Andrei. Probing Nanoscale Objects in Liquids through Membranes with Near-Field Microwave Microscopy. United States.
Tselev, Alexander, and Kolmakov, Andrei. 2015. "Probing Nanoscale Objects in Liquids through Membranes with Near-Field Microwave Microscopy". United States. doi:.
title = {Probing Nanoscale Objects in Liquids through Membranes with Near-Field Microwave Microscopy},
author = {Tselev, Alexander and Kolmakov, Andrei},
abstractNote = {},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = 2015,
month = 1

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  • Here, noninvasive in situ nanoscale imaging in liquid environments is a current imperative in the analysis of delicate biomedical objects and electrochemical processes at reactive liquid–solid interfaces. Microwaves of a few gigahertz frequencies offer photons with energies of ≈10 μeV, which can affect neither electronic states nor chemical bonds in condensed matter. Here, we describe an implementation of scanning near-field microwave microscopy for imaging in liquids using ultrathin molecular impermeable membranes separating scanning probes from samples enclosed in environmental cells. We imaged a model electroplating reaction as well as individual live cells. Through a side-by-side comparison of the microwave imagingmore » with scanning electron microscopy, we demonstrate the advantage of microwaves for artifact-free imaging.« less
  • Infrared scattering scanning near-field optical microscopy (s-SNOM) is an apertureless superfocusing technique that uses the antenna properties of a conducting atomic force microscope (AFM) tip to achieve infrared spatial resolution below the diffraction limit. The instrument can be used either in imaging mode, where a fixed wavelength light source is tuned to a molecular resonance and the AFM raster scans an image, or in spectroscopy mode where the AFM is held stationary over a feature of interest and the light frequency is varied to obtain a spectrum. In either case, a strong, stable, coherent infrared source is required. Here wemore » demonstrate the integration of a broadly tunable external cavity quantum cascade laser (ECQCL) into an s-SNOM and use it to obtain infrared spectra of microcrystals of chemicals adsorbed onto gold substrates. Residues of the explosive compound tetryl was deposited onto gold substrates. s-SNOM experiments were performed in the 1260-1400 cm-1 tuning range of the ECQCL, corresponding to the NO2 symmetric stretch vibrational fingerprint region. Vibrational infrared spectra were collected on individual chemical domains with a collection area of *500nm2 and compared to ensemble averaged far-field reflection-absorption infrared spectroscopy (RAIRS) results.« less
  • Near-field microwave microscopy can be used as an alternative to atomic-force microscopy or Raman microscopy in determination of graphene thickness. We evaluated the values of AC impedance for few layer graphene. The impedance of mono and few-layer graphene at 4GHz was found predominantly active. Near-field microwave microscopy allows simultaneous imaging of location, geometry, thickness, and distribution of electrical properties of graphene without device fabrication. Our results may be useful for design of future graphene-based microwave devices.
  • Abstract not provided.