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Title: Single-Event Characterization of the 20 nm Xilinx Kintex UltraScale Field-Programmable Gate Array under Heavy Ion Irradiation.

Abstract

Abstract not provided.

Authors:
; ; ; ; ; ;
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1255787
Report Number(s):
SAND2015-4235C
590329
DOE Contract Number:
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the Nuclear and Space Radiation Effects Conference held July 13-17, 2015 in Boston, MA.
Country of Publication:
United States
Language:
English

Citation Formats

Lee, David S., Allen, Greg, Swift, Gary, Cannon, Matthew, Wirthlin, Michael, Koga, Rokutaro, and Huey, Kangsen. Single-Event Characterization of the 20 nm Xilinx Kintex UltraScale Field-Programmable Gate Array under Heavy Ion Irradiation.. United States: N. p., 2015. Web.
Lee, David S., Allen, Greg, Swift, Gary, Cannon, Matthew, Wirthlin, Michael, Koga, Rokutaro, & Huey, Kangsen. Single-Event Characterization of the 20 nm Xilinx Kintex UltraScale Field-Programmable Gate Array under Heavy Ion Irradiation.. United States.
Lee, David S., Allen, Greg, Swift, Gary, Cannon, Matthew, Wirthlin, Michael, Koga, Rokutaro, and Huey, Kangsen. Fri . "Single-Event Characterization of the 20 nm Xilinx Kintex UltraScale Field-Programmable Gate Array under Heavy Ion Irradiation.". United States. doi:. https://www.osti.gov/servlets/purl/1255787.
@article{osti_1255787,
title = {Single-Event Characterization of the 20 nm Xilinx Kintex UltraScale Field-Programmable Gate Array under Heavy Ion Irradiation.},
author = {Lee, David S. and Allen, Greg and Swift, Gary and Cannon, Matthew and Wirthlin, Michael and Koga, Rokutaro and Huey, Kangsen},
abstractNote = {Abstract not provided.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Fri May 01 00:00:00 EDT 2015},
month = {Fri May 01 00:00:00 EDT 2015}
}

Conference:
Other availability
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