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Thin film bismuth iron oxides useful for piezoelectric devices

Patent ·
OSTI ID:1255124
The present invention provides for a composition comprising a thin film of BiFeO.sub.3 having a thickness ranging from 20 nm to 300 nm, a first electrode in contact with the BiFeO.sub.3 thin film, and a second electrode in contact with the BiFeO.sub.3 thin film; wherein the first and second electrodes are in electrical communication. The composition is free or essentially free of lead (Pb). The BFO thin film is has the piezoelectric property of changing its volume and/or shape when an electric field is applied to the BFO thin film.
Research Organization:
Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC02-05CH11231
Assignee:
The Regents of the University of California (Oakland, CA)
Patent Number(s):
9,356,224
Application Number:
12/916,209
OSTI ID:
1255124
Country of Publication:
United States
Language:
English

References (12)

Polarization rotation mechanism for ultrahigh electromechanical response in single-crystal piezoelectrics journal January 2000
Simultaneous Z-Contrast and Phase Contrast Imaging of Oxygen in Ceramic Interfaces journal August 2004
Multiferroic BiFeO 3 films: domain structure and polarization dynamics journal December 2006
Synthesis, Structure, and Properties of New Perovskite PbVO3 journal August 2004
Isosymmetric structural phase transitions: phenomenology and examples journal October 1995
Neutron Powder Diffraction Study on the Crystal and Magnetic Structures of BiCoO3 journal February 2006
Ferroelectric size effects in multiferroic BiFeO3 thin films journal June 2007
Multiferroic and magnetoelectric materials journal August 2006
Structural and multiferroic properties of BiFeO3 thin films at room temperature journal September 2004
Origin of morphotropic phase boundaries in ferroelectrics journal January 2008
A mechanism for the 150 µC cm−2 polarization of BiFeO3 films based on first-principles calculations and new structural data journal January 2006
Multiferroics progress and prospects in thin films journal January 2007

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