Hard x-ray spectroscopy and imaging by a reflection zone plate in the presence of astigmatism

Journal Article · Thu Dec 17 00:00:00 EST 2015 · Optics Letters

DOI:https://doi.org/10.1364/OL.41.000029· OSTI ID:1254270

Braig, Christoph ^[1]; Lochel, Heike ^[1]; Firsov, Alexander ^[1]; Brzhezinskaya, Maria ^[1]; Hafner, Aljosa ^[1]; Rehanek, Jens ^[2]; Wojcik, Michael ^[3]; Macrander, Albert ^[3]; Assoufid, Lahsen ^[3]; Erko, Alexei ^[1]

---

1. Helmholtz-Zentrum Berlin fur Materialien und Energie, Berlin (Germany)
2. Paul Scherrer Inst. (PSI), Villigen (Switzerland)
3. Argonne National Lab. (ANL), Lemont, IL (United States)

Here, the feasibility of an off-axis x-ray reflection zone plate to perform wavelength-dispersive spectroscopy, on-axis point focusing, and two-dimensional imaging is demonstrated by means of one and the same diffractive optical element (DOE) at a synchrotron radiation facility. The resolving power varies between 3 × 10¹ and 4 × 10² in the range of 7.6 keV to 9.0 keV, with its maximum at the design energy of 8.3 keV. This result is verified using an adjustable entrance slit, by which horizontal (H) and vertical (V) focusing to 0.85 μm(H) and 1.29 μm(V) is obtained near the sagittal focal plane of the astigmatic configuration. An angular and axial scan proves an accessible field of view of at least 0.6 arcmin × 0.8 arcmin and a focal depth of ±0.86 mm. Supported by the grating efficiency of around 17.5% and a very short pulse elongation, future precision x-ray fluorescence and absorption studies of transition metals at their K-edge on an ultrashort timescale could benefit from our findings.

• Research Organization: Argonne National Laboratory (ANL), Argonne, IL (United States)
• Sponsoring Organization: German Federal Ministry of Education and Research (BMBF); USDOE Office of Science (SC), Basic Energy Sciences (BES)
• Grant/Contract Number: AC02-06CH11357; AC-02-06CH11357
• OSTI ID: 1254270
• Alternate ID(s): OSTI ID: 1229912
• Journal Information: Optics Letters, Vol. 41, Issue 1; ISSN 0146-9592
• Publisher: Optical Society of America (OSA)
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
diffractive lenses
gratings
spectroscopy x-ray
X-ray imaging