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Title: Development and implementation of a portable grating interferometer system as a standard tool for testing optics at the Advanced Photon Source beamline 1-BM

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.4950775· OSTI ID:1332986
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  1. Argonne National Lab. (ANL), Lemont, IL (United States). Advanced Photon Source (APS)
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We developed a portable X-ray grating interferometer setup as a standard tool for testing optics at the Advanced Photon Source (APS) beamline 1-BM. The interferometer can be operated in phase-stepping, Moiré, or single-grating harmonic imaging mode with 1-D or 2-D gratings. All of the interferometer motions are motorized; hence, it is much easier and quicker to switch between the different modes of operation. A novel aspect of this new instrument is its designed portability. While the setup is designed to be primarily used as a standard tool for testing optics at 1-BM, it could be potentially deployed at other APS beamlines for beam coherence and wavefront characterization or imaging. Herein, the design of the interferometer system is described in detail and coherence measurements obtained at the APS 34-ID-E beamline are presented. The coherence was probed in two directions using a 2-D checkerboard, a linear, and a circular grating at X-ray energies of 8 keV, 11 keV, and 18 keV.

Research Organization:
Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities Division
Grant/Contract Number:
AC02-06CH11357
OSTI ID:
1332986
Alternate ID(s):
OSTI ID: 1254051
Journal Information:
Review of Scientific Instruments, Vol. 87, Issue 5; ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 23 works
Citation information provided by
Web of Science

References (12)

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X‐ray Laue Diffraction Microscopy in 3D at the Advanced Photon Source conference January 2011
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Shearing Interferometer for Quantifying the Coherence of Hard X-Ray Beams journal April 2005
Small-displacement monochromator for microdiffraction experiments journal May 2000
Development of single grating x-ray Talbot interferometer as a feedback loop sensor element of an adaptive x-ray mirror system conference September 2014
Shearing Interferometer for Quantifying the Coherence of Hard X-Ray Beams text January 2005

Cited By (5)

Wavefront sensing at X-ray free-electron lasers journal June 2019
Absolute metrology method of the x-ray mirror with speckle scanning technique journal January 2019
High-accuracy wavefront sensing for x-ray free electron lasers text January 2018
Wavefront sensing at X-ray free-electron lasers text January 2019
Wavefront sensing at X-ray free-electron lasers text January 2019

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