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Title: Method for measurement of diffusivity: Calorimetric studies of Fe/Ni multilayer thin films

Authors:
;
Publication Date:
Sponsoring Org.:
USDOE Advanced Research Projects Agency - Energy (ARPA-E); USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1251499
Grant/Contract Number:
AC02-98CH10886
Resource Type:
Journal Article: Publisher's Accepted Manuscript
Journal Name:
Scripta Materialia
Additional Journal Information:
Journal Volume: 104; Journal Issue: C; Related Information: CHORUS Timestamp: 2016-09-06 06:34:28; Journal ID: ISSN 1359-6462
Publisher:
Elsevier
Country of Publication:
United States
Language:
English

Citation Formats

Liu, Jiaxing, and Barmak, Katayun. Method for measurement of diffusivity: Calorimetric studies of Fe/Ni multilayer thin films. United States: N. p., 2015. Web. doi:10.1016/j.scriptamat.2015.02.031.
Liu, Jiaxing, & Barmak, Katayun. Method for measurement of diffusivity: Calorimetric studies of Fe/Ni multilayer thin films. United States. doi:10.1016/j.scriptamat.2015.02.031.
Liu, Jiaxing, and Barmak, Katayun. Wed . "Method for measurement of diffusivity: Calorimetric studies of Fe/Ni multilayer thin films". United States. doi:10.1016/j.scriptamat.2015.02.031.
@article{osti_1251499,
title = {Method for measurement of diffusivity: Calorimetric studies of Fe/Ni multilayer thin films},
author = {Liu, Jiaxing and Barmak, Katayun},
abstractNote = {},
doi = {10.1016/j.scriptamat.2015.02.031},
journal = {Scripta Materialia},
number = C,
volume = 104,
place = {United States},
year = {Wed Jul 01 00:00:00 EDT 2015},
month = {Wed Jul 01 00:00:00 EDT 2015}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record at 10.1016/j.scriptamat.2015.02.031

Citation Metrics:
Cited by: 2works
Citation information provided by
Web of Science

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  • A calorimetric method for the measurement of diffusivity in thin film multilayers is introduced and applied to the Fe Ni system. Using this method, the diffusivity in [Fe (25 nm)/Ni (25 nm)](20) multilayer thin films is measured as 4 x 10(-3)exp(-1.6 +/- 0.1 eV/ k(B)T) cm(2)/s, respectively. The diffusion mechanism in the multilayers and its relevance to laboratory synthesis of L1(0) ordered FeNi are discussed. (C) 2015 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
  • Measurements of the thermal diffusivity of thin films on substrate have been performed by the photoacoustic method. In order to examine the method the authors have built a new apparatus and proposed (1) a system calibration procedure using optically and thermally thick reference samples and (2) a data analysis procedure based on the RG (Rosencwaig and Gersho) theory. As a result of using a transparent photoacoustic cell, the systematic errors which are caused by stray light have been reduced. With this apparatus, measurements have been performed on platinum, titanium, and stainless steel (SUS304) thin foils (thickness form 50 to 100more » [mu]m) with three different liquid backing materials (water, glycerol, and ethyl alcohol). The reproducibility was within [+-]7% regardless of film thickness and substrate materials. 27 refs., 9 figs., 2 tabs.« less
  • We have utilized differential scanning calorimetry to monitor the solid-state reaction of crystalline metals to form an amorphous alloy in multilayered thin-film diffusion couples of elemental Ni and Zr. The heat of formation of amorphous Ni/sub 68/Zr/sub 32/ alloy from the elemental metals is measured directly and found to be 35 +- 5 kJ/mole. The kinetics of these reactions have been examined. The activation energy for interdiffusion in the amorphous phase is determined to be E = 1.05 +- 0.05 eV.
  • In measurements of thermal diffusivity, by an ac calorimetry method, on films of materials of high thermal diffusivity, attention should be paid to the effects of the sample length, i.e., the reflection of ac temperature waves at the sample edge. For such a case, the apparent thermal diffusivity of the sample having a finite length is given analytically as a function of frequency. Measurements were performed on diamond/Si composite films. The overall behavior of the frequency dependence of the apparent thermal diffusivity obtained is satisfactorily explained by the analytical expression. The true thermal diffusivity is obtained by fitting a theoreticalmore » curve to the experimental results. Especially when the apparent thermal diffusivity saturates in a high-frequency region, the saturated value gives the true thermal diffusivity.« less
  • Thermal diffusivity of diamond/Si composite films was measured in the direction parallel to the plane of the film by an ac calorimetric method. The effect of two-dimensional heat conduction on the measured results appears to be due to the difference in the thermal diffusivities of the layers. The thermal diffusivity measured by the thermocouple attached on the diamond side was higher than that on the silicon side. This might be due to the two-dimensional effects. As a result, the estimated thermal diffusivity of the diamond layer from the result of composite film detected on the diamond side is higher thanmore » that detected on the Si side. This gives rise to an error in the estimated thermal diffusivity of the diamond layer. A criterion for the deviation of the estimated thermal diffusivity is proposed.« less