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Title: TEM based high resolution and low-dose scanning electron nanodiffraction technique for nanostructure imaging and analysis

Authors:
; ; ; ;
Publication Date:
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1250905
Grant/Contract Number:
DEFG02-01ER45923
Resource Type:
Journal Article: Publisher's Accepted Manuscript
Journal Name:
Micron
Additional Journal Information:
Journal Volume: 71; Journal Issue: C; Related Information: CHORUS Timestamp: 2016-09-04 16:29:53; Journal ID: ISSN 0968-4328
Publisher:
Elsevier
Country of Publication:
United Kingdom
Language:
English

Citation Formats

Kim, Kyou-Hyun, Xing, Hui, Zuo, Jian-Min, Zhang, Peng, and Wang, Haifeng. TEM based high resolution and low-dose scanning electron nanodiffraction technique for nanostructure imaging and analysis. United Kingdom: N. p., 2015. Web. doi:10.1016/j.micron.2015.01.002.
Kim, Kyou-Hyun, Xing, Hui, Zuo, Jian-Min, Zhang, Peng, & Wang, Haifeng. TEM based high resolution and low-dose scanning electron nanodiffraction technique for nanostructure imaging and analysis. United Kingdom. doi:10.1016/j.micron.2015.01.002.
Kim, Kyou-Hyun, Xing, Hui, Zuo, Jian-Min, Zhang, Peng, and Wang, Haifeng. Wed . "TEM based high resolution and low-dose scanning electron nanodiffraction technique for nanostructure imaging and analysis". United Kingdom. doi:10.1016/j.micron.2015.01.002.
@article{osti_1250905,
title = {TEM based high resolution and low-dose scanning electron nanodiffraction technique for nanostructure imaging and analysis},
author = {Kim, Kyou-Hyun and Xing, Hui and Zuo, Jian-Min and Zhang, Peng and Wang, Haifeng},
abstractNote = {},
doi = {10.1016/j.micron.2015.01.002},
journal = {Micron},
number = C,
volume = 71,
place = {United Kingdom},
year = {Wed Apr 01 00:00:00 EDT 2015},
month = {Wed Apr 01 00:00:00 EDT 2015}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record at 10.1016/j.micron.2015.01.002

Citation Metrics:
Cited by: 6 works
Citation information provided by
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