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Title: Characterizing Switching Variability in TaOx Memristors.

Abstract

Abstract not provided.

Authors:
; ; ; ;
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1248653
Report Number(s):
SAND2015-2621C
581971
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the 2015 MRS Spring Meeting.
Country of Publication:
United States
Language:
English

Citation Formats

Hughart, David Russell, Mickel, Patrick R., Apodaca, Roger, Haase, Gad S, and Marinella, Matthew. Characterizing Switching Variability in TaOx Memristors.. United States: N. p., 2015. Web.
Hughart, David Russell, Mickel, Patrick R., Apodaca, Roger, Haase, Gad S, & Marinella, Matthew. Characterizing Switching Variability in TaOx Memristors.. United States.
Hughart, David Russell, Mickel, Patrick R., Apodaca, Roger, Haase, Gad S, and Marinella, Matthew. Wed . "Characterizing Switching Variability in TaOx Memristors.". United States. doi:. https://www.osti.gov/servlets/purl/1248653.
@article{osti_1248653,
title = {Characterizing Switching Variability in TaOx Memristors.},
author = {Hughart, David Russell and Mickel, Patrick R. and Apodaca, Roger and Haase, Gad S and Marinella, Matthew},
abstractNote = {Abstract not provided.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Wed Apr 01 00:00:00 EDT 2015},
month = {Wed Apr 01 00:00:00 EDT 2015}
}

Conference:
Other availability
Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that hold this conference proceeding.

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