Neutron-Induced Failures in Semiconductor Devices
- Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
This slide presentation explores single event effect, environmental neutron flux, system response, the Los Alamos Neutron Science Center (LANSCE) neutron testing facility, examples of SEE measurements, and recent interest in thermal neutrons.
- Research Organization:
- Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC52-06NA25396
- OSTI ID:
- 1248097
- Report Number(s):
- LA-UR-16-22309
- Country of Publication:
- United States
- Language:
- English
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