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Title: Trapping Characteristics and Parametric Shifts in Lateral GaN HEMTs with SiO2/AlGaN Gate Stacks.

Abstract

Abstract not provided.

Authors:
; ; ; ; ; ; ;
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1246875
Report Number(s):
SAND2015-2488C
579784
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the MRS Spring 2015.
Country of Publication:
United States
Language:
English

Citation Formats

King, Michael Patrick, Piedra, D., Dickerson, Jeramy Ray, Dasgupta, S., Sun, M., Marinella, Matthew, Palacios, T., and Kaplar, Robert. Trapping Characteristics and Parametric Shifts in Lateral GaN HEMTs with SiO2/AlGaN Gate Stacks.. United States: N. p., 2015. Web.
King, Michael Patrick, Piedra, D., Dickerson, Jeramy Ray, Dasgupta, S., Sun, M., Marinella, Matthew, Palacios, T., & Kaplar, Robert. Trapping Characteristics and Parametric Shifts in Lateral GaN HEMTs with SiO2/AlGaN Gate Stacks.. United States.
King, Michael Patrick, Piedra, D., Dickerson, Jeramy Ray, Dasgupta, S., Sun, M., Marinella, Matthew, Palacios, T., and Kaplar, Robert. Wed . "Trapping Characteristics and Parametric Shifts in Lateral GaN HEMTs with SiO2/AlGaN Gate Stacks.". United States. doi:. https://www.osti.gov/servlets/purl/1246875.
@article{osti_1246875,
title = {Trapping Characteristics and Parametric Shifts in Lateral GaN HEMTs with SiO2/AlGaN Gate Stacks.},
author = {King, Michael Patrick and Piedra, D. and Dickerson, Jeramy Ray and Dasgupta, S. and Sun, M. and Marinella, Matthew and Palacios, T. and Kaplar, Robert},
abstractNote = {Abstract not provided.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Wed Apr 01 00:00:00 EDT 2015},
month = {Wed Apr 01 00:00:00 EDT 2015}
}

Conference:
Other availability
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