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Title: Trapping Characteristics and Parametric Shifts in Lateral GaN HEMTs with SiO2/AlGaN Gate Stacks.

Abstract

Abstract not provided.

Authors:
; ; ; ; ; ; ;
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1246843
Report Number(s):
SAND2015-1663C
579722
DOE Contract Number:
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the IRPS.
Country of Publication:
United States
Language:
English

Citation Formats

King, Michael Patrick, Dickerson, Jeramy Ray, DasGupta, Sandeepan, Marinella, Matthew, Kaplar, Robert, Piedra, D., Sun, M., and Palacios, T. Trapping Characteristics and Parametric Shifts in Lateral GaN HEMTs with SiO2/AlGaN Gate Stacks.. United States: N. p., 2015. Web.
King, Michael Patrick, Dickerson, Jeramy Ray, DasGupta, Sandeepan, Marinella, Matthew, Kaplar, Robert, Piedra, D., Sun, M., & Palacios, T. Trapping Characteristics and Parametric Shifts in Lateral GaN HEMTs with SiO2/AlGaN Gate Stacks.. United States.
King, Michael Patrick, Dickerson, Jeramy Ray, DasGupta, Sandeepan, Marinella, Matthew, Kaplar, Robert, Piedra, D., Sun, M., and Palacios, T. Sun . "Trapping Characteristics and Parametric Shifts in Lateral GaN HEMTs with SiO2/AlGaN Gate Stacks.". United States. doi:. https://www.osti.gov/servlets/purl/1246843.
@article{osti_1246843,
title = {Trapping Characteristics and Parametric Shifts in Lateral GaN HEMTs with SiO2/AlGaN Gate Stacks.},
author = {King, Michael Patrick and Dickerson, Jeramy Ray and DasGupta, Sandeepan and Marinella, Matthew and Kaplar, Robert and Piedra, D. and Sun, M. and Palacios, T.},
abstractNote = {Abstract not provided.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Sun Mar 01 00:00:00 EST 2015},
month = {Sun Mar 01 00:00:00 EST 2015}
}

Conference:
Other availability
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