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Title: Transmission electron microscopy investigation of Ag diffusion mechanisms in β-SiC

Authors:
; ; ; ;
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1246647
Resource Type:
Journal Article: Publisher's Accepted Manuscript
Journal Name:
Journal of Nuclear Materials
Additional Journal Information:
Journal Name: Journal of Nuclear Materials Journal Volume: 457 Journal Issue: C; Journal ID: ISSN 0022-3115
Publisher:
Elsevier
Country of Publication:
Netherlands
Language:
English

Citation Formats

Coward, Robert A., Winkler, Christopher R., Hanson, William A., Jablonski, Michael L., and Taheri, Mitra L.. Transmission electron microscopy investigation of Ag diffusion mechanisms in β-SiC. Netherlands: N. p., 2015. Web. doi:10.1016/j.jnucmat.2014.11.116.
Coward, Robert A., Winkler, Christopher R., Hanson, William A., Jablonski, Michael L., & Taheri, Mitra L.. Transmission electron microscopy investigation of Ag diffusion mechanisms in β-SiC. Netherlands. doi:10.1016/j.jnucmat.2014.11.116.
Coward, Robert A., Winkler, Christopher R., Hanson, William A., Jablonski, Michael L., and Taheri, Mitra L.. Sun . "Transmission electron microscopy investigation of Ag diffusion mechanisms in β-SiC". Netherlands. doi:10.1016/j.jnucmat.2014.11.116.
@article{osti_1246647,
title = {Transmission electron microscopy investigation of Ag diffusion mechanisms in β-SiC},
author = {Coward, Robert A. and Winkler, Christopher R. and Hanson, William A. and Jablonski, Michael L. and Taheri, Mitra L.},
abstractNote = {},
doi = {10.1016/j.jnucmat.2014.11.116},
journal = {Journal of Nuclear Materials},
number = C,
volume = 457,
place = {Netherlands},
year = {Sun Feb 01 00:00:00 EST 2015},
month = {Sun Feb 01 00:00:00 EST 2015}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record at 10.1016/j.jnucmat.2014.11.116

Citation Metrics:
Cited by: 7 works
Citation information provided by
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