Spectroscopy and control of near-surface defects in conductive thin film ZnO

Kelly, Leah L.; Racke, David A.; Schulz, Philip; Li, Hong; Winget, Paul; Kim, Hyungchul; Ndione, Paul; Sigdel, Ajaya K.; Brédas, Jean-Luc; Berry, Joseph J.; Graham, Samuel; Monti, Oliver L. A.

doi:10.1088/0953-8984/28/9/094007

Title: Spectroscopy and control of near-surface defects in conductive thin film ZnO

Journal Article · Fri Feb 12 00:00:00 EST 2016 · Journal of Physics. Condensed Matter

DOI:https://doi.org/10.1088/0953-8984/28/9/094007· OSTI ID:1242686

Kelly, Leah L.; Racke, David A.; Schulz, Philip; Li, Hong; Winget, Paul; Kim, Hyungchul; Ndione, Paul; Sigdel, Ajaya K.; Brédas, Jean-Luc; Berry, Joseph J.; Graham, Samuel; Monti, Oliver L. A.

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Research Organization:: Energy Frontier Research Centers (EFRC) (United States). Center for Interface Science: Solar Electric Materials (CISSEM); National Renewable Energy Lab. (NREL), Golden, CO (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

DOE Contract Number:: AC36-08GO28308

OSTI ID:: 1242686

Report Number(s):: NREL/JA-5K00-66154

Journal Information:: Journal of Physics. Condensed Matter, Vol. 28, Issue 9; ISSN 0953-8984

Publisher:: IOP Publishing

Country of Publication:: United States

Language:: English

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