GHz laser-free time-resolved transmission electron microscopy: A stroboscopic high-duty-cycle method

Qiu, Jiaqi; Zhu, Yimei; Ha, Gwanghui; Jing, Chunguang; Baryshev, Sergey V.; Reed, Bryan W.; Lau, June W.

doi:10.1016/j.ultramic.2015.11.006

Title: GHz laser-free time-resolved transmission electron microscopy: A stroboscopic high-duty-cycle method

Journal Article · Tue Nov 10 00:00:00 EST 2015 · Ultramicroscopy

DOI:https://doi.org/10.1016/j.ultramic.2015.11.006· OSTI ID:1240700

Qiu, Jiaqi ^[1]; Zhu, Yimei ^[2]; Ha, Gwanghui ^[1]; Jing, Chunguang ^[1]; Baryshev, Sergey V. ^[1]; Reed, Bryan W. ^[3]; Lau, June W. ^[4]

Euclid TechLabs, Bolingbrook, IL (United States)
Brookhaven National Lab. (BNL), Upton, NY (United States)
Integrated Dynamic Electron Solutions, Pleasanton, CA (United States)
National Institute of Standards and Technology, Gaithersburg, MD (United States)

In this study, a device and a method for producing ultrashort electron pulses with GHz repetition rates via pulsing an input direct current (dc) electron beam are provided. The device and the method are based on an electromagnetic-mechanical pulser (EMMP) that consists of a series of transverse deflecting cavities and magnetic quadrupoles. The EMMP modulates and chops the incoming dc electron beam and converts it into pico- and sub-pico-second electron pulse sequences (pulse trains) at >1 GHz repetition rates, as well as controllably manipulates the resulting pulses. Ultimately, it leads to negligible electron pulse phase-space degradation compared to the incoming dc beam parameters. The temporal pulse length and repetition rate for the EMMP can be continuously tunable over wide ranges.

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Research Organization:: Brookhaven National Laboratory (BNL), Upton, NY (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: SC00112704; SC0013121; SC0012704

OSTI ID:: 1240700

Alternate ID(s):: OSTI ID: 1396434

Report Number(s):: BNL-111862-2016-JA; R&D Project: MA015MACA; KC0201010

Journal Information:: Ultramicroscopy, Vol. 161, Issue C; ISSN 0304-3991

Publisher:: ElsevierCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 21 works

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Cited By (3)

Picosecond Fresnel transmission electron microscopy Schliep, Karl B.; Quarterman, P.; Wang, Jian-Ping Applied Physics Letters, Vol. 110, Issue 22 https://doi.org/10.1063/1.4984586	journal	May 2017
Design and characterization of dielectric filled TM ₁₁₀ microwave cavities for ultrafast electron microscopy Verhoeven, W.; van Rens, J. F. M.; Kemper, A. H. Review of Scientific Instruments, Vol. 90, Issue 8 https://doi.org/10.1063/1.5080003	journal	August 2019
Atomic-scale imaging of ultrafast materials dynamics Flannigan, David J.; Lindenberg, Aaron M. MRS Bulletin, Vol. 43, Issue 7 https://doi.org/10.1557/mrs.2018.146	journal	July 2018

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75 CONDENSED MATTER PHYSICS
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Title: GHz laser-free time-resolved transmission electron microscopy: A stroboscopic high-duty-cycle method

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