Multi-particle inspection using associated particle sources

Bingham, Philip R.; Mihalczo, John T.; Mullens, James A.; McConchie, Seth M.; Hausladen, Paul A.

Title: Multi-particle inspection using associated particle sources

Patent · Tue Feb 16 00:00:00 EST 2016

OSTI ID:1240408

Bingham, Philip R.; Mihalczo, John T.; Mullens, James A.; McConchie, Seth M.; Hausladen, Paul A.

Disclosed herein are representative embodiments of methods, apparatus, and systems for performing combined neutron and gamma ray radiography. For example, one exemplary system comprises: a neutron source; a set of alpha particle detectors configured to detect alpha particles associated with neutrons generated by the neutron source; neutron detectors positioned to detect at least some of the neutrons generated by the neutron source; a gamma ray source; a set of verification gamma ray detectors configured to detect verification gamma rays associated with gamma rays generated by the gamma ray source; a set of gamma ray detectors configured to detect gamma rays generated by the gamma ray source; and an interrogation region located between the neutron source, the gamma ray source, the neutron detectors, and the gamma ray detectors.

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Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)

Sponsoring Organization:: USDOE

DOE Contract Number:: AC05-00OR22725

Assignee:: UT-Battelle, LLC (Oak Ridge, TN)

Patent Number(s):: 9261468

Application Number:: 13/801,695

OSTI ID:: 1240408

Resource Relation:: Patent File Date: 2013 Mar 13

Country of Publication:: United States

Language:: English

References (22)

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