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Title: Effects of Device Scaling on Angular Single-Event Effects.

Abstract

Abstract not provided.

Authors:
;
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1239367
Report Number(s):
SAND2016-0886C
619003
DOE Contract Number:
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the Microelectronics Reliability & Qualification Working Meeting held February 9-10, 2016 in El Segundo, CA.
Country of Publication:
United States
Language:
English

Citation Formats

Lee, David S., and Draper, Jeffrey. Effects of Device Scaling on Angular Single-Event Effects.. United States: N. p., 2016. Web.
Lee, David S., & Draper, Jeffrey. Effects of Device Scaling on Angular Single-Event Effects.. United States.
Lee, David S., and Draper, Jeffrey. Mon . "Effects of Device Scaling on Angular Single-Event Effects.". United States. doi:. https://www.osti.gov/servlets/purl/1239367.
@article{osti_1239367,
title = {Effects of Device Scaling on Angular Single-Event Effects.},
author = {Lee, David S. and Draper, Jeffrey},
abstractNote = {Abstract not provided.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Mon Feb 01 00:00:00 EST 2016},
month = {Mon Feb 01 00:00:00 EST 2016}
}

Conference:
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