Giant optical enhancement of strain gradient in ferroelectric BiFeO3 thin films and its physical origin
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Stanford Univ., CA (United States)
- Univ. of Wisconsin, Madison, WI (United States)
- Univ. of Connecticut, Storrs, CT (United States)
- Northwestern Univ., Evanston, IL (United States)
- Northwestern Univ., Evanston, IL (United States); Argonne National Lab. (ANL), Argonne, IL (United States)
- Cornell Univ., Ithaca, NY (United States); Cornell Univ., Ithaca, NY (United States). Kavli Inst. for Nanoscale Science
Through mapping of the spatiotemporal strain profile in ferroelectric BiFeO3 epitaxial thin films, we report an optically initiated dynamic enhancement of the strain gradient of 105–106 m-1 that lasts up to a few ns depending on the film thickness. Correlating with transient optical absorption measurements, the enhancement of the strain gradient is attributed to a piezoelectric effect driven by a transient screening field mediated by excitons. In conclusion, these findings not only demonstrate a new possible way of controlling the flexoelectric effect, but also reveal the important role of exciton dynamics in photostriction and photovoltaic effects in ferroelectrics.
- Research Organization:
- Argonne National Laboratory (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- Grant/Contract Number:
- AC02-06CH11357; FG02-10ER46147
- OSTI ID:
- 1237489
- Journal Information:
- Scientific Reports, Vol. 5; ISSN 2045-2322
- Publisher:
- Nature Publishing GroupCopyright Statement
- Country of Publication:
- United States
- Language:
- English
Cited by: 30 works
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