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Title: When will low-contrast features be visible in a STEM X-ray spectrum image?

Authors:
 [1]
  1. ORNL
Publication Date:
Research Org.:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1234322
DOE Contract Number:
AC05-00OR22725
Resource Type:
Conference
Resource Relation:
Conference: Microscopy and Microanalysis, Portland, OR, USA, 20150803, 20150803
Country of Publication:
United States
Language:
English

Citation Formats

Parish, Chad M. When will low-contrast features be visible in a STEM X-ray spectrum image?. United States: N. p., 2015. Web.
Parish, Chad M. When will low-contrast features be visible in a STEM X-ray spectrum image?. United States.
Parish, Chad M. Thu . "When will low-contrast features be visible in a STEM X-ray spectrum image?". United States. doi:. https://www.osti.gov/servlets/purl/1234322.
@article{osti_1234322,
title = {When will low-contrast features be visible in a STEM X-ray spectrum image?},
author = {Parish, Chad M},
abstractNote = {},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Thu Jan 01 00:00:00 EST 2015},
month = {Thu Jan 01 00:00:00 EST 2015}
}

Conference:
Other availability
Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that hold this conference proceeding.

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