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Title: Atomically layer-by-layer diffusion of oxygen/hydrogen in highly epitaxial PrBaCo2O5.5+δ thin films

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.4937926· OSTI ID:1468476
 [1];  [1];  [1];  [1];  [1];  [1];  [1];  [2];  [3];  [4];  [4]
  1. Univ. of Texas, San Antonio, TX (United States)
  2. Jiangsu Univ. of Science and Technology, Jiangsu (China)
  3. North Carolina State Univ., Raleigh, NC (United States)
  4. Dalian Univ. of Technology, Dalian (China)

Single-crystalline epitaxial thin films of PrBaCo2O5.5+δ (PrBCO) were prepared, and their resistance R(t) under a switching flow of oxidizing and reducing gases were measured as a function of the gas flow time t in the temperature range of 200–800 °C. During the oxidation cycle under O2, the PrBCO films exhibit fast oscillations in their dR(t)/dt vs. t plots, which reflect the oxidation processes, Co2+/Co3+ → Co3+ and Co3+ → Co3+/Co4+, that the Co atoms of PrBCO undergo. Each oscillation consists of two peaks, with larger and smaller peaks representing the oxygen/hydrogen diffusion through the (BaO)(CoO2)(PrO)(CoO2) layers of PrBCO via the oxygen-vacancy-exchange mechanism. Furthermore, this finding paves a significant avenue for cathode materials operating in low-temperature solid-oxide-fuel-cell devices and for chemical sensors with wide range of operating temperature.

Research Organization:
Univ. of Texas at San Antonio, TX (United States)
Sponsoring Organization:
USDOE Office of Fossil Energy (FE)
Grant/Contract Number:
FE0003780
OSTI ID:
1468476
Alternate ID(s):
OSTI ID: 1229600
Journal Information:
Applied Physics Letters, Vol. 107, Issue 24; ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 11 works
Citation information provided by
Web of Science

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