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Title: Compositional homogeneity and X-ray topographic analyses of CdTe xSe 1-x grown by the vertical Bridgman technique

Abstract

We grew CdTe xSe 1-x crystals with nominal Se concentrations of 5%, 7%, and 10% by the vertical Bridgman technique, and evaluated their compositional homogeneity and structural quality at the NSLS’ X-ray fluorescence and white beam X-ray topography beam lines. Both X-ray fluorescence and photoluminescence mapping revealed very high compositional homogeneity of the CdTe xSe 1-x crystals. Here, we noted that those crystals with higher concentrations of Se were more prone to twinning than those with a lower content. The crystals were fairly free from strains and contained low concentrations of sub-grain boundaries and their networks.

Authors:
 [1];  [1];  [1];  [1];  [1];  [2];  [2];  [1];  [1];  [3];  [3];  [1]
  1. Brookhaven National Lab. (BNL), Upton, NY (United States)
  2. Brookhaven National Lab. (BNL), Upton, NY (United States); Korea Univ., Seoul (Republic of Korea)
  3. Fisk Univ., Nashville, TN (United States)
Publication Date:
Research Org.:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1228972
Report Number(s):
BNL-111047-2015-JA
Journal ID: ISSN 0022-0248
DOE Contract Number:  
SC00112704
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Crystal Growth; Journal Volume: 411; Journal Issue: C
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; A1. characterization; A1. defects; A1. Te-inclusions; A1. Subgrain boundary; B2. CdTeSe; B2. Semiconducting II-VI materials

Citation Formats

Roy, U. N., Bolotnikov, A. E., Camarda, G. S., Cui, Y., Hossain, A., Lee, K., Lee, W., Tappero, R., Yang, Ge, Cui, Y., Burger, A., and James, R. B. Compositional homogeneity and X-ray topographic analyses of CdTexSe1-x grown by the vertical Bridgman technique. United States: N. p., 2015. Web. doi:10.1016/j.jcrysgro.2014.10.057.
Roy, U. N., Bolotnikov, A. E., Camarda, G. S., Cui, Y., Hossain, A., Lee, K., Lee, W., Tappero, R., Yang, Ge, Cui, Y., Burger, A., & James, R. B. Compositional homogeneity and X-ray topographic analyses of CdTexSe1-x grown by the vertical Bridgman technique. United States. doi:10.1016/j.jcrysgro.2014.10.057.
Roy, U. N., Bolotnikov, A. E., Camarda, G. S., Cui, Y., Hossain, A., Lee, K., Lee, W., Tappero, R., Yang, Ge, Cui, Y., Burger, A., and James, R. B. Sun . "Compositional homogeneity and X-ray topographic analyses of CdTexSe1-x grown by the vertical Bridgman technique". United States. doi:10.1016/j.jcrysgro.2014.10.057.
@article{osti_1228972,
title = {Compositional homogeneity and X-ray topographic analyses of CdTexSe1-x grown by the vertical Bridgman technique},
author = {Roy, U. N. and Bolotnikov, A. E. and Camarda, G. S. and Cui, Y. and Hossain, A. and Lee, K. and Lee, W. and Tappero, R. and Yang, Ge and Cui, Y. and Burger, A. and James, R. B.},
abstractNote = {We grew CdTexSe1-x crystals with nominal Se concentrations of 5%, 7%, and 10% by the vertical Bridgman technique, and evaluated their compositional homogeneity and structural quality at the NSLS’ X-ray fluorescence and white beam X-ray topography beam lines. Both X-ray fluorescence and photoluminescence mapping revealed very high compositional homogeneity of the CdTexSe1-x crystals. Here, we noted that those crystals with higher concentrations of Se were more prone to twinning than those with a lower content. The crystals were fairly free from strains and contained low concentrations of sub-grain boundaries and their networks.},
doi = {10.1016/j.jcrysgro.2014.10.057},
journal = {Journal of Crystal Growth},
number = C,
volume = 411,
place = {United States},
year = {Sun Feb 01 00:00:00 EST 2015},
month = {Sun Feb 01 00:00:00 EST 2015}
}