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Title: A Method to Determine Fault Vectors in 4H-SiC From Stacking Sequences Observed on High Resolution Transmission Electron Microscopy Images

Authors:
; ; ; ; ; ; ; ; ;
Publication Date:
Research Org.:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1228884
Report Number(s):
BNL-110959-2015-JA
Journal ID: ISSN 0021-8979
DOE Contract Number:  
SC00112704
Resource Type:
Journal Article
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 116; Journal Issue: 10; Journal ID: ISSN 0021-8979
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English

Citation Formats

Wu, F, Wang, H, Raghothamachar, B, Dudley, M, Mueller, S, Chung, G, Sanchez, E, Hansen, D, Loboda, M, and et al. A Method to Determine Fault Vectors in 4H-SiC From Stacking Sequences Observed on High Resolution Transmission Electron Microscopy Images. United States: N. p., 2014. Web. doi:10.1063/1.4895136.
Wu, F, Wang, H, Raghothamachar, B, Dudley, M, Mueller, S, Chung, G, Sanchez, E, Hansen, D, Loboda, M, & et al. A Method to Determine Fault Vectors in 4H-SiC From Stacking Sequences Observed on High Resolution Transmission Electron Microscopy Images. United States. doi:10.1063/1.4895136.
Wu, F, Wang, H, Raghothamachar, B, Dudley, M, Mueller, S, Chung, G, Sanchez, E, Hansen, D, Loboda, M, and et al. Sun . "A Method to Determine Fault Vectors in 4H-SiC From Stacking Sequences Observed on High Resolution Transmission Electron Microscopy Images". United States. doi:10.1063/1.4895136.
@article{osti_1228884,
title = {A Method to Determine Fault Vectors in 4H-SiC From Stacking Sequences Observed on High Resolution Transmission Electron Microscopy Images},
author = {Wu, F and Wang, H and Raghothamachar, B and Dudley, M and Mueller, S and Chung, G and Sanchez, E and Hansen, D and Loboda, M and et al.},
abstractNote = {},
doi = {10.1063/1.4895136},
journal = {Journal of Applied Physics},
issn = {0021-8979},
number = 10,
volume = 116,
place = {United States},
year = {2014},
month = {9}
}