Structural properties of Bi2−xMnxSe3 thin films grown via molecular beam epitaxy

Babakiray, Sercan; Johnson, Trent A.; Borisov, Pavel; Holcomb, Mikel B.; Lederman, David; Marcus, Matthew A.; Tarafder, Kartick

doi:10.1063/1.4927171

Title: Structural properties of Bi2−xMnxSe3 thin films grown via molecular beam epitaxy

Journal Article · Wed Jul 22 00:00:00 EDT 2015 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4927171· OSTI ID:1228694

Babakiray, Sercan ^[1]; Johnson, Trent A. ^[1];

^[1]; Holcomb, Mikel B. ^[1]; Lederman, David ^[1]; Marcus, Matthew A. ^[2]; Tarafder, Kartick ^[3]

Department of Physics and Astronomy, West Virginia University, Morgantown, West Virginia 26506-6315, USA
Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA
Department of Physics, BITS-Pilani Hyderabad Campus, Secunderabad, Andhra Pradesh 500078, India

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Sponsoring Organization:: USDOE

Grant/Contract Number:: AC02-05CH11231

OSTI ID:: 1228694

Journal Information:: Journal of Applied Physics, Journal Name: Journal of Applied Physics Vol. 118 Journal Issue: 4; ISSN 0021-8979

Publisher:: American Institute of PhysicsCopyright Statement

Country of Publication:: United States

Language:: English

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References (47)

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