Examination of electronic structure differences between CIGSSe and CZTSSe by photoluminescence study

Tai, Kong Fai; Gershon, Talia; Gunawan, Oki; Huan, Cheng Hon Alfred

doi:10.1063/1.4922493

Title: Examination of electronic structure differences between CIGSSe and CZTSSe by photoluminescence study

Journal Article · Tue Jun 16 00:00:00 EDT 2015 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4922493· OSTI ID:1228636

^[1]; Gershon, Talia ^[2]; Gunawan, Oki ^[2]; Huan, Cheng Hon Alfred ^[1]

Division of Physics and Applied Physics, School of Physical & Mathematical Sciences, Nanyang Technological University, 21 Nanyang Link, Singapore 637371
IBM T.J. Watson Research Center, PO Box 218, Yorktown Heights, New York 10598, USA

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Sponsoring Organization:: USDOE

Grant/Contract Number:: EE0006334

OSTI ID:: 1228636

Journal Information:: Journal of Applied Physics, Journal Name: Journal of Applied Physics Vol. 117 Journal Issue: 23; ISSN 0021-8979

Publisher:: American Institute of PhysicsCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 26 works

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References (24)

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