Direct measurements of irradiation-induced creep in micropillars of amorphous Cu56Ti38Ag6, Zr52Ni48, Si, and SiO2

Özerinç, Sezer; Kim, Hoe Joon; Averback, Robert S.; King, William P.

doi:10.1063/1.4905019

Title: Direct measurements of irradiation-induced creep in micropillars of amorphous Cu56Ti38Ag6, Zr52Ni48, Si, and SiO2

Journal Article · Wed Jan 14 00:00:00 EST 2015 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4905019· OSTI ID:1228492

Özerinç, Sezer ^[1]; Kim, Hoe Joon ^[1]; Averback, Robert S. ^[2]; King, William P. ^[3]

Department of Mechanical Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, USA
Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, USA
Department of Mechanical Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, USA, Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, USA

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Sponsoring Organization:: USDOE

Grant/Contract Number:: DEFG02-05ER46217

OSTI ID:: 1228492

Journal Information:: Journal of Applied Physics, Journal Name: Journal of Applied Physics Vol. 117 Journal Issue: 2; ISSN 0021-8979

Publisher:: American Institute of PhysicsCopyright Statement

Country of Publication:: United States

Language:: English

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