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Imaging based refractometer for hyperspectral refractive index detection

Patent ·
OSTI ID:1226819
Refractometers for simultaneously measuring refractive index of a sample over a range of wavelengths of light include dispersive and focusing optical systems. An optical beam including the range of wavelengths is spectrally spread along a first axis and focused along a second axis so as to be incident to an interface between the sample and a prism at a range of angles of incidence including a critical angle for at least one wavelength. An imaging detector is situated to receive the spectrally spread and focused light from the interface and form an image corresponding to angle of incidence as a function of wavelength. One or more critical angles are identified and corresponding refractive indices are determined.
Research Organization:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC05-00OR22725
Assignee:
UT-Battelle, LLC (Oak Ridge, TN)
Patent Number(s):
9,194,798
Application Number:
13/768,802
OSTI ID:
1226819
Country of Publication:
United States
Language:
English

References (5)

Critical angle laser refractometer journal March 2006
A two-reflection divergent differentiating critical angle refractometer journal May 2011
Full-field imaging-based instantaneous hyperspectral absolute refractive index measurement journal January 2012
Absolute refractive index measurement method over a broad wavelength region based on white-light interferometry journal January 2010
Automated measurement of the refractive index of fluids journal January 2008

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