skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Strain mapping at nanometer resolution using advanced nano-beam electron diffraction

Authors:
 [1];  [2];  [3];  [1];  [1];  [1];  [4]
  1. National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA
  2. National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA, Department of Materials Science and Engineering, University of California, Berkeley, California 94720, USA, Physics of Nanostructured Materials, Faculty of Physics, University of Vienna, 1090 Vienna, Austria
  3. Institute for Advanced Research, Nagoya University, Nagoya 464-8603, Japan
  4. National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA, Department of Materials Science and Engineering, University of California, Berkeley, California 94720, USA
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1226763
Grant/Contract Number:  
AC02-05CH11231
Resource Type:
Journal Article: Publisher's Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Name: Applied Physics Letters Journal Volume: 106 Journal Issue: 25; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics
Country of Publication:
United States
Language:
English

Citation Formats

Ozdol, V. B., Gammer, C., Jin, X. G., Ercius, P., Ophus, C., Ciston, J., and Minor, A. M.. Strain mapping at nanometer resolution using advanced nano-beam electron diffraction. United States: N. p., 2015. Web. doi:10.1063/1.4922994.
Ozdol, V. B., Gammer, C., Jin, X. G., Ercius, P., Ophus, C., Ciston, J., & Minor, A. M.. Strain mapping at nanometer resolution using advanced nano-beam electron diffraction. United States. doi:10.1063/1.4922994.
Ozdol, V. B., Gammer, C., Jin, X. G., Ercius, P., Ophus, C., Ciston, J., and Minor, A. M.. Wed . "Strain mapping at nanometer resolution using advanced nano-beam electron diffraction". United States. doi:10.1063/1.4922994.
@article{osti_1226763,
title = {Strain mapping at nanometer resolution using advanced nano-beam electron diffraction},
author = {Ozdol, V. B. and Gammer, C. and Jin, X. G. and Ercius, P. and Ophus, C. and Ciston, J. and Minor, A. M.},
abstractNote = {},
doi = {10.1063/1.4922994},
journal = {Applied Physics Letters},
issn = {0003-6951},
number = 25,
volume = 106,
place = {United States},
year = {2015},
month = {6}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record at 10.1063/1.4922994

Citation Metrics:
Cited by: 19 works
Citation information provided by
Web of Science

Save / Share:

Works referenced in this record:

Quantitative measurement of displacement and strain fields from HREM micrographs
journal, August 1998