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Title: Holmium hafnate: An emerging electronic device material

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.4915503· OSTI ID:1226721
ORCiD logo [1]; ORCiD logo [1];  [1]; ORCiD logo [1];  [1];  [2];  [1]
  1. Department of Physics and Institute for Functional Nanomaterials, University of Puerto Rico, P.O. Box 70377, San Juan, Puerto Rico 00936-8377, USA
  2. Department of Physics and Institute for Functional Nanomaterials, University of Puerto Rico, P.O. Box 70377, San Juan, Puerto Rico 00936-8377, USA, Department of Physics, Cavendish Laboratory, University of Cambridge, Cambridge CB3 OHE, United Kingdom

Sponsoring Organization:
USDOE
Grant/Contract Number:
FG02-08ER46526
OSTI ID:
1226721
Journal Information:
Applied Physics Letters, Journal Name: Applied Physics Letters Vol. 106 Journal Issue: 11; ISSN 0003-6951
Publisher:
American Institute of PhysicsCopyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 8 works
Citation information provided by
Web of Science

References (17)

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Properties of the new electronic device material LaGdO 3 : Properties of the new electronic device material LaGdO journal July 2013
Oxide pyrochlores — A review journal January 1983
Influence of interface layer composition on the electrical properties of epitaxial Gd2O3 thin films for high-K application journal March 2007
Forward book January 2008
Dielectric properties and electrical conduction of high-k LaGdO 3 ceramics journal May 2012
Materials Fundamentals of Gate Dielectrics book July 2005
High-κ gate dielectrics: Current status and materials properties considerations journal May 2001
Revised effective ionic radii and systematic studies of interatomic distances in halides and chalcogenides journal September 1976
Nuclear waste disposal—pyrochlore (A2B2O7): Nuclear waste form for the immobilization of plutonium and “minor” actinides journal June 2004
Spectroscopic Investigations of the Structural Phase Transition in Gd 2 (Ti 1 - y Zr y ) 2 O 7 Pyrochlores journal May 2002
Nonlinear capacitance variations in amorphous oxide metal-insulator-metal structures journal October 2007
Poole-Frenkel Effect and Schottky Effect in Metal-Insulator-Metal Systems journal March 1967
Recent advances in magnetic structure determination by neutron powder diffraction journal October 1993
Band-gap measurements of bulk and nanoscale hematite by soft x-ray spectroscopy journal January 2009
Reactive evaporation of low-defect density hafnia journal January 1993
Thermal stability and electrical characteristics of ultrathin hafnium oxide gate dielectric reoxidized with rapid thermal annealing journal April 2000

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