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Title: Cherenkov Light-based Beam Profiling for Ultrarelativistic Electron Beams

Abstract

We describe a beam profile monitor design based on Cherenkov light emitted from a charged particle beam in an air gap. The main components of the profile monitor are silicon wafers used to reflect Cherenkov light onto a camera lens system. The design allows for measuring large beam sizes, with large photon yield per beam charge and excellent signal linearity with beam charge. Furthermore, the profile monitor signal is independent of the particle energy for ultrarelativistic particles. Different design and parameter considerations are discussed. A Cherenkov light-based profile monitor has been installed at the FACET User Facility at SLAC. Finally, we report on the measured performance of this profile monitor.

Authors:
 [1];  [2];  [2];  [2];  [3]
  1. Univ. of Oslo (Norway); SLAC National Accelerator Lab., Menlo Park, CA (United States)
  2. SLAC National Accelerator Lab., Menlo Park, CA (United States)
  3. SLAC National Accelerator Lab., Menlo Park, CA (United States); Norwegian Univ. of Science and Technology, Trondheim (Norway)
Publication Date:
Research Org.:
SLAC National Accelerator Lab., Menlo Park, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1224682
Alternate Identifier(s):
OSTI ID: 1246233
Report Number(s):
SLAC-PUB-16412
Journal ID: ISSN 0168-9002
Grant/Contract Number:  
AC02-76SF00515
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Additional Journal Information:
Journal Volume: 783; Journal ID: ISSN 0168-9002
Publisher:
Elsevier
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; electron beams; profile monitor; Cherenkov light; FACET user facility; ACCPHY; INST

Citation Formats

Adli, Erik, Gessner, S. J., Corde, S., Hogan, M. J., and Bjerke, H. H. Cherenkov Light-based Beam Profiling for Ultrarelativistic Electron Beams. United States: N. p., 2015. Web. doi:10.1016/j.nima.2015.02.003.
Adli, Erik, Gessner, S. J., Corde, S., Hogan, M. J., & Bjerke, H. H. Cherenkov Light-based Beam Profiling for Ultrarelativistic Electron Beams. United States. doi:10.1016/j.nima.2015.02.003.
Adli, Erik, Gessner, S. J., Corde, S., Hogan, M. J., and Bjerke, H. H. Mon . "Cherenkov Light-based Beam Profiling for Ultrarelativistic Electron Beams". United States. doi:10.1016/j.nima.2015.02.003. https://www.osti.gov/servlets/purl/1224682.
@article{osti_1224682,
title = {Cherenkov Light-based Beam Profiling for Ultrarelativistic Electron Beams},
author = {Adli, Erik and Gessner, S. J. and Corde, S. and Hogan, M. J. and Bjerke, H. H.},
abstractNote = {We describe a beam profile monitor design based on Cherenkov light emitted from a charged particle beam in an air gap. The main components of the profile monitor are silicon wafers used to reflect Cherenkov light onto a camera lens system. The design allows for measuring large beam sizes, with large photon yield per beam charge and excellent signal linearity with beam charge. Furthermore, the profile monitor signal is independent of the particle energy for ultrarelativistic particles. Different design and parameter considerations are discussed. A Cherenkov light-based profile monitor has been installed at the FACET User Facility at SLAC. Finally, we report on the measured performance of this profile monitor.},
doi = {10.1016/j.nima.2015.02.003},
journal = {Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment},
number = ,
volume = 783,
place = {United States},
year = {Mon Feb 09 00:00:00 EST 2015},
month = {Mon Feb 09 00:00:00 EST 2015}
}

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Cited by: 8 works
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