Realizing in-plane surface diffraction by x-ray multiple-beam diffraction with large incidence angle
Abstract
Based on rigorous dynamical-theory calculations, we demonstrate in this paper the principle of an x-ray multiple-beam diffraction (MBD) scheme that overcomes the long-lasting difficulties of high-resolution in-plane diffraction from crystal surfaces. This scheme only utilizes symmetric reflection geometry with large incident angles but activates the out-of-plane and in-plane diffraction processes simultaneously and separately in the continuous MBD planes. The in-plane diffraction is realized by detoured MBD, where the intermediate diffracted waves propagate parallel to the surface, which corresponds to an absolute Bragg surface diffraction configuration that is extremely sensitive to surface structures. Finally, a series of MBD diffraction and imaging techniques may be developed from this principle to study surface/interface (misfit) strains, lateral nanostructures, and phase transitions of a wide range of (pseudo)cubic crystal structures, including ultrathin epitaxial films and multilayers, quantum dots, strain-engineered semiconductor or (multi)ferroic materials, etc.
- Authors:
-
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Nanjing Univ. (China)
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- Publication Date:
- Research Org.:
- Argonne National Lab. (ANL), Argonne, IL (United States); Brookhaven National Lab. (BNL), Upton, NY (United States); Nanjing Univ. (China)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES); Ministry of Science and Technology (MOST) (China); National Natural Science Foundation of China (NSFC)
- OSTI Identifier:
- 1392293
- Alternate Identifier(s):
- OSTI ID: 1224272
- Grant/Contract Number:
- AC02-06CH11357; AC02-98CH10886; 2012CB921502; 2010CB630705; 11034005; 61475070; 91321312
- Resource Type:
- Journal Article: Accepted Manuscript
- Journal Name:
- Applied Physics Letters
- Additional Journal Information:
- Journal Volume: 105; Journal Issue: 18; Journal ID: ISSN 0003-6951
- Publisher:
- American Institute of Physics (AIP)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; x-ray diffraction; surface structure; surface phase transitions; reflectivity; crystal structure
Citation Formats
Huang, Xian-Rong, Peng, Ru-Wen, Gog, Thomas, Siddons, D. P., and Assoufid, Lahsen. Realizing in-plane surface diffraction by x-ray multiple-beam diffraction with large incidence angle. United States: N. p., 2014.
Web. doi:10.1063/1.4901046.
Huang, Xian-Rong, Peng, Ru-Wen, Gog, Thomas, Siddons, D. P., & Assoufid, Lahsen. Realizing in-plane surface diffraction by x-ray multiple-beam diffraction with large incidence angle. United States. https://doi.org/10.1063/1.4901046
Huang, Xian-Rong, Peng, Ru-Wen, Gog, Thomas, Siddons, D. P., and Assoufid, Lahsen. 2014.
"Realizing in-plane surface diffraction by x-ray multiple-beam diffraction with large incidence angle". United States. https://doi.org/10.1063/1.4901046. https://www.osti.gov/servlets/purl/1392293.
@article{osti_1392293,
title = {Realizing in-plane surface diffraction by x-ray multiple-beam diffraction with large incidence angle},
author = {Huang, Xian-Rong and Peng, Ru-Wen and Gog, Thomas and Siddons, D. P. and Assoufid, Lahsen},
abstractNote = {Based on rigorous dynamical-theory calculations, we demonstrate in this paper the principle of an x-ray multiple-beam diffraction (MBD) scheme that overcomes the long-lasting difficulties of high-resolution in-plane diffraction from crystal surfaces. This scheme only utilizes symmetric reflection geometry with large incident angles but activates the out-of-plane and in-plane diffraction processes simultaneously and separately in the continuous MBD planes. The in-plane diffraction is realized by detoured MBD, where the intermediate diffracted waves propagate parallel to the surface, which corresponds to an absolute Bragg surface diffraction configuration that is extremely sensitive to surface structures. Finally, a series of MBD diffraction and imaging techniques may be developed from this principle to study surface/interface (misfit) strains, lateral nanostructures, and phase transitions of a wide range of (pseudo)cubic crystal structures, including ultrathin epitaxial films and multilayers, quantum dots, strain-engineered semiconductor or (multi)ferroic materials, etc.},
doi = {10.1063/1.4901046},
url = {https://www.osti.gov/biblio/1392293},
journal = {Applied Physics Letters},
issn = {0003-6951},
number = 18,
volume = 105,
place = {United States},
year = {Tue Nov 04 00:00:00 EST 2014},
month = {Tue Nov 04 00:00:00 EST 2014}
}
Web of Science
Works referenced in this record:
X-Ray Multiple-Wave Diffraction
book, January 2004
- Chang, Shih-Lin; Cardona, Manuel; Fulde, Peter
- Springer Series in Solid-State Sciences, Vol. 143
Competing Misfit Relaxation Mechanisms in Epitaxial Correlated Oxides
journal, March 2013
- Sandiumenge, Felip; Santiso, José; Balcells, Lluís
- Physical Review Letters, Vol. 110, Issue 10
Tuning Magnetic Coupling in Thin Films with Epitaxial Strain
journal, April 2014
- Lupascu, A.; Clancy, J. P.; Gretarsson, H.
- Physical Review Letters, Vol. 112, Issue 14
Orbital Control of Noncollinear Magnetic Order in Nickel Oxide Heterostructures
journal, September 2013
- Frano, A.; Schierle, E.; Haverkort, M. W.
- Physical Review Letters, Vol. 111, Issue 10
High-geometrical-resolution imaging of dislocations in SiC using monochromatic synchrotron topography
journal, December 2007
- Huang, X. R.; Black, D. R.; Macrander, A. T.
- Applied Physics Letters, Vol. 91, Issue 23
Spin-Orbital Superstructure in Strained Ferrimagnetic Perovskite Cobalt Oxide
journal, July 2013
- Fujioka, J.; Yamasaki, Y.; Nakao, H.
- Physical Review Letters, Vol. 111, Issue 2
Multiple-beam x-ray diffraction near exact backscattering in silicon
journal, January 2001
- Sutter, John P.; Alp, E. Ercan; Hu, Michael Y.
- Physical Review B, Vol. 63, Issue 9
High resolution grazing-incidence in-plane x-ray diffraction for measuring the strain of a Si thin layer
journal, November 2010
- Omote, Kazuhiko
- Journal of Physics: Condensed Matter, Vol. 22, Issue 47
X-Ray Resonance in Crystal Cavities: Realization of Fabry-Perot Resonator for Hard X Rays
journal, May 2005
- Chang, S. -L.; Stetsko, Yu. P.; Tang, M. -T.
- Physical Review Letters, Vol. 94, Issue 17
Continuous X-ray multiple-beam diffraction with primary Bragg angle from 0 to 90°
journal, September 2014
- Huang, Xian-Rong; Jia, Quanjie; Wieczorek, Michael
- Journal of Applied Crystallography, Vol. 47, Issue 5
Ultimate upgrade for US synchrotron
journal, September 2013
- Samuel Reich, Eugenie
- Nature, Vol. 501, Issue 7466
Fourier coupled-wave diffraction theory of periodic structures and crystals
journal, June 2013
- Huang, Xian-Rong; Peng, Ru-Wen; Hönnicke, Marcelo G.
- Physical Review A, Vol. 87, Issue 6
Lattice strain distribution resolved by X-ray Bragg-surface diffraction in an Si matrix distorted by embedded FeSi 2 nanoparticles
journal, November 2013
- Lang, Rossano; de Menezes, Alan S.; dos Santos, Adenilson O.
- Journal of Applied Crystallography, Vol. 46, Issue 6
A strong ferroelectric ferromagnet created by means of spin–lattice coupling
journal, August 2010
- Lee, June Hyuk; Fang, Lei; Vlahos, Eftihia
- Nature, Vol. 466, Issue 7309
Dynamical x-ray diffraction of multilayers and superlattices: Recursion matrix extension to grazing angles
journal, February 1998
- Stepanov, S. A.; Kondrashkina, E. A.; Köhler, R.
- Physical Review B, Vol. 57, Issue 8
Interplay between Anisotropic Strain Relaxation and Uniaxial Interface Magnetic Anisotropy in Epitaxial Fe Films on (001) GaAs
journal, January 2003
- Thomas, O.; Shen, Q.; Schieffer, P.
- Physical Review Letters, Vol. 90, Issue 1
Works referencing / citing this record:
Assessment of phase transition and thermal expansion coefficients by means of secondary multiple reflections of Renninger scans
journal, October 2019
- dos Santos, Adenilson O.; Lang, Rossano; Sasaki, José M.
- Journal of Applied Crystallography, Vol. 52, Issue 6