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Title: Realizing in-plane surface diffraction by x-ray multiple-beam diffraction with large incidence angle

Abstract

Based on rigorous dynamical-theory calculations, we demonstrate in this paper the principle of an x-ray multiple-beam diffraction (MBD) scheme that overcomes the long-lasting difficulties of high-resolution in-plane diffraction from crystal surfaces. This scheme only utilizes symmetric reflection geometry with large incident angles but activates the out-of-plane and in-plane diffraction processes simultaneously and separately in the continuous MBD planes. The in-plane diffraction is realized by detoured MBD, where the intermediate diffracted waves propagate parallel to the surface, which corresponds to an absolute Bragg surface diffraction configuration that is extremely sensitive to surface structures. Finally, a series of MBD diffraction and imaging techniques may be developed from this principle to study surface/interface (misfit) strains, lateral nanostructures, and phase transitions of a wide range of (pseudo)cubic crystal structures, including ultrathin epitaxial films and multilayers, quantum dots, strain-engineered semiconductor or (multi)ferroic materials, etc.

Authors:
 [1];  [2];  [1];  [3];  [1]
  1. Argonne National Lab. (ANL), Argonne, IL (United States)
  2. Nanjing Univ. (China)
  3. Brookhaven National Lab. (BNL), Upton, NY (United States)
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States); Brookhaven National Lab. (BNL), Upton, NY (United States); Nanjing Univ. (China)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES); Ministry of Science and Technology (MOST) (China); National Natural Science Foundation of China (NSFC)
OSTI Identifier:
1392293
Alternate Identifier(s):
OSTI ID: 1224272
Grant/Contract Number:  
AC02-06CH11357; AC02-98CH10886; 2012CB921502; 2010CB630705; 11034005; 61475070; 91321312
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 105; Journal Issue: 18; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; x-ray diffraction; surface structure; surface phase transitions; reflectivity; crystal structure

Citation Formats

Huang, Xian-Rong, Peng, Ru-Wen, Gog, Thomas, Siddons, D. P., and Assoufid, Lahsen. Realizing in-plane surface diffraction by x-ray multiple-beam diffraction with large incidence angle. United States: N. p., 2014. Web. doi:10.1063/1.4901046.
Huang, Xian-Rong, Peng, Ru-Wen, Gog, Thomas, Siddons, D. P., & Assoufid, Lahsen. Realizing in-plane surface diffraction by x-ray multiple-beam diffraction with large incidence angle. United States. https://doi.org/10.1063/1.4901046
Huang, Xian-Rong, Peng, Ru-Wen, Gog, Thomas, Siddons, D. P., and Assoufid, Lahsen. 2014. "Realizing in-plane surface diffraction by x-ray multiple-beam diffraction with large incidence angle". United States. https://doi.org/10.1063/1.4901046. https://www.osti.gov/servlets/purl/1392293.
@article{osti_1392293,
title = {Realizing in-plane surface diffraction by x-ray multiple-beam diffraction with large incidence angle},
author = {Huang, Xian-Rong and Peng, Ru-Wen and Gog, Thomas and Siddons, D. P. and Assoufid, Lahsen},
abstractNote = {Based on rigorous dynamical-theory calculations, we demonstrate in this paper the principle of an x-ray multiple-beam diffraction (MBD) scheme that overcomes the long-lasting difficulties of high-resolution in-plane diffraction from crystal surfaces. This scheme only utilizes symmetric reflection geometry with large incident angles but activates the out-of-plane and in-plane diffraction processes simultaneously and separately in the continuous MBD planes. The in-plane diffraction is realized by detoured MBD, where the intermediate diffracted waves propagate parallel to the surface, which corresponds to an absolute Bragg surface diffraction configuration that is extremely sensitive to surface structures. Finally, a series of MBD diffraction and imaging techniques may be developed from this principle to study surface/interface (misfit) strains, lateral nanostructures, and phase transitions of a wide range of (pseudo)cubic crystal structures, including ultrathin epitaxial films and multilayers, quantum dots, strain-engineered semiconductor or (multi)ferroic materials, etc.},
doi = {10.1063/1.4901046},
url = {https://www.osti.gov/biblio/1392293}, journal = {Applied Physics Letters},
issn = {0003-6951},
number = 18,
volume = 105,
place = {United States},
year = {Tue Nov 04 00:00:00 EST 2014},
month = {Tue Nov 04 00:00:00 EST 2014}
}

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Cited by: 4 works
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Works referenced in this record:

X-Ray Multiple-Wave Diffraction
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Competing Misfit Relaxation Mechanisms in Epitaxial Correlated Oxides
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Tuning Magnetic Coupling in Sr 2 IrO 4 Thin Films with Epitaxial Strain
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Orbital Control of Noncollinear Magnetic Order in Nickel Oxide Heterostructures
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Spin-Orbital Superstructure in Strained Ferrimagnetic Perovskite Cobalt Oxide
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Multiple-beam x-ray diffraction near exact backscattering in silicon
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Lattice strain distribution resolved by X-ray Bragg-surface diffraction in an Si matrix distorted by embedded FeSi 2 nanoparticles
journal, November 2013


A strong ferroelectric ferromagnet created by means of spin–lattice coupling
journal, August 2010


Dynamical x-ray diffraction of multilayers and superlattices: Recursion matrix extension to grazing angles
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Works referencing / citing this record:

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