Single-shot Zeff dense plasma diagnostic through simultaneous refraction and attenuation measurements with a Talbot–Lau x-ray moiré deflectometer

Valdivia, M. P.; Stutman, D.; Finkenthal, M.

doi:10.1364/AO.54.002577

Title: Single-shot Z_eff dense plasma diagnostic through simultaneous refraction and attenuation measurements with a Talbot–Lau x-ray moiré deflectometer

Journal Article · Mon Mar 23 00:00:00 EDT 2015 · Applied Optics

DOI:https://doi.org/10.1364/AO.54.002577· OSTI ID:1223269

Valdivia, M. P. ^[1]; Stutman, D. ^[1]; Finkenthal, M. ^[1]

John Hopkins Univ., Baltimore, MD (United States)

The Talbot–Lau x-ray moiré deflectometer is a powerful plasma diagnostic capable of delivering simultaneous refraction and attenuation information through the accurate detection of x-ray phase shift and intensity. The diagnostic can provide the index of refraction n=1₋δ + iβ of an object (dense plasma, for example) placed in the x-ray beam by independently measuring both δ and β, which are directly related to the electron density n_e and the attenuation coefficient μ respectively. Since δ and β depend on the effective atomic number Z _eff, a map can be obtained from the ratio between phase and absorption images acquired in a single shot. The Talbot–Lau x-ray moiré deflectometer and its corresponding data acquisition and processing are briefly described to illustrate how the above is achieved; Z _eff values of test objects within the 4₋12 range were obtained experimentally through simultaneous refraction and attenuation measurements. We show that Z _eff mapping of objects does not require previous knowledge of sample length or shape. In conclusion, the determination of Z _eff from refraction and attenuation measurements with moiré deflectometry could be of high interest to various domains of high energy density research, such as shocked materials and inertial confinement fusion experiments, as well as material science and nondestructive testing.

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Research Organization:: Johns Hopkins Univ., Baltimore, MD (United States). Dept. of Physics and Astronomy

Sponsoring Organization:: USDOE National Nuclear Security Administration (NNSA)

Grant/Contract Number:: NA0001835

OSTI ID:: 1223269

Alternate ID(s):: OSTI ID: 1258589

Journal Information:: Applied Optics, Vol. 54, Issue 10; ISSN 0003-6935

Publisher:: Optical Society of America (OSA)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 11 works

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An x-ray backlit Talbot-Lau deflectometer for high-energy-density electron density diagnostics Valdivia, M. P.; Stutman, D.; Stoeckl, C. Review of Scientific Instruments, Vol. 87, Issue 2 https://doi.org/10.1063/1.4941441	journal	February 2016
X-ray backlighter requirements for refraction-based electron density diagnostics through Talbot-Lau deflectometry Valdivia, M. P.; Veloso, F.; Stutman, D. Review of Scientific Instruments, Vol. 89, Issue 10 https://doi.org/10.1063/1.5039342	journal	October 2018
A color x-ray camera for 2–6 keV using a mass produced back illuminated complementary metal oxide semiconductor sensor Holden, William M.; Hoidn, Oliver R.; Seidler, Gerald T. Review of Scientific Instruments, Vol. 89, Issue 9 https://doi.org/10.1063/1.5047934	journal	September 2018

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Title: Single-shot Z_eff dense plasma diagnostic through simultaneous refraction and attenuation measurements with a Talbot–Lau x-ray moiré deflectometer