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Title: Evaluation of partial coherence correction in X-ray ptychography

Journal Article · · Optics Express
DOI:https://doi.org/10.1364/OE.23.005452· OSTI ID:1215676
 [1];  [2];  [2];  [3];  [4];  [2];  [1]
  1. Univ. College London, London (United Kingdom); Research Complex at Hartwell, Oxford (United Kingdom)
  2. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Univ. of Oregon, Eugene, OR (United States)
  3. SLAC National Accelerator Lab., Menlo Park, CA (United States); DESY, Hamburg (Germany)
  4. Brookhaven National Lab. (BNL), Upton, NY (United States)
+ Show Author Affiliations

Coherent X-ray Diffraction Imaging (CDI) and X-ray ptychography both heavily rely on the high degree of spatial coherence of the X-ray illumination for sufficient experimental data quality for reconstruction convergence. Nevertheless, the majority of the available synchrotron undulator sources have a limited degree of partial coherence, leading to reduced data quality and a lower speckle contrast in the coherent diffraction patterns. It is still an open question whether experimentalists should compromise the coherence properties of an X-ray source in exchange for a higher flux density at a sample, especially when some materials of scientific interest are relatively weak scatterers. A previous study has suggested that in CDI, the best strategy for the study of strong phase objects is to maintain a high degree of coherence of the illuminating X-rays because of the broadening of solution space resulting from the strong phase structures. In this article, we demonstrate the first systematic analysis of the effectiveness of partial coherence correction in ptychography as a function of the coherence properties, degree of complexity of illumination (degree of phase diversity of the probe) and sample phase complexity. We have also performed analysis of how well ptychographic algorithms refine X-ray probe and complex coherence functions when those variables are unknown at the start of reconstructions, for noise-free simulated data, in the case of both real-valued and highly-complex objects.

Research Organization:
Argonne National Lab. (ANL), Argonne, IL (United States); SLAC National Accelerator Lab., Menlo Park, CA (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
Grant/Contract Number:
AC02-06CH11357; FG02-11ER46831; AC02-05CH11231; AC02-05CH11231, AC03-76SF00515
OSTI ID:
1215676
Alternate ID(s):
OSTI ID: 1221598
Journal Information:
Optics Express, Vol. 23, Issue 5; ISSN 1094-4087
Publisher:
Optical Society of America (OSA)Copyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 27 works
Citation information provided by
Web of Science

References (28)

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Soft X-ray spectromicroscopy using ptychography with randomly phased illumination journal April 2013
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Cited By (5)

Transverse Coherence Limited Coherent Diffraction Imaging using a Molybdenum Soft X-ray Laser Pumped at Moderate Pump Energies journal July 2017
X-ray ptychography on low-dimensional hard-condensed matter materials journal March 2019
Non-iterative method for phase retrieval and coherence characterization by focus variation using a fixed star-shaped mask journal January 2018
Quantitative phase and amplitude imaging with an efficient support constraint journal January 2019
Ptychography with multiple wavelength illumination journal January 2019

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