Precise annealing of focal plane arrays for optical detection
Patent
·
OSTI ID:1215622
Precise annealing of identified defective regions of a Focal Plane Array ("FPA") (e.g., exclusive of non-defective regions of the FPA) facilitates removal of defects from an FPA that has been hybridized and/or packaged with readout electronics. Radiation is optionally applied under operating conditions, such as under cryogenic temperatures, such that performance of an FPA can be evaluated before, during, and after annealing without requiring thermal cycling.
- Research Organization:
- Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC04-94AL85000
- Assignee:
- Sandia Corporation (Albuquerque, NM)
- Patent Number(s):
- 9,142,465
- Application Number:
- 13/956,868
- OSTI ID:
- 1215622
- Country of Publication:
- United States
- Language:
- English
Response of machining-damaged single-crystalline silicon wafers to nanosecond pulsed laser irradiation
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journal | March 2007 |
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