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Title: On the Relationship between the Natural Line Width and Lifetime of X-Ray Transitions

 [1];  [1];  [1];  [1]
  1. ORNL
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
DOE Contract Number:
Resource Type:
Resource Relation:
Conference: INMM 56th Annual Meeting, Indian Wells, CA, USA, 20150712, 20150712
Country of Publication:
United States

Citation Formats

Croft, Stephen, Nicholson, Andrew D, McElroy, Robert Dennis, and Guzzardo, Tyler. On the Relationship between the Natural Line Width and Lifetime of X-Ray Transitions. United States: N. p., 2015. Web.
Croft, Stephen, Nicholson, Andrew D, McElroy, Robert Dennis, & Guzzardo, Tyler. On the Relationship between the Natural Line Width and Lifetime of X-Ray Transitions. United States.
Croft, Stephen, Nicholson, Andrew D, McElroy, Robert Dennis, and Guzzardo, Tyler. 2015. "On the Relationship between the Natural Line Width and Lifetime of X-Ray Transitions". United States. doi:.
title = {On the Relationship between the Natural Line Width and Lifetime of X-Ray Transitions},
author = {Croft, Stephen and Nicholson, Andrew D and McElroy, Robert Dennis and Guzzardo, Tyler},
abstractNote = {},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = 2015,
month = 1

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