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Title: Thermal stability of amorphous Zn-In-Sn-O films

Authors:
; ; ; ; ; ; ; ;  [1];  [2]
  1. (NWU)
  2. (
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
Sponsoring Org.:
DOE - BASIC ENERGY SCIENCESNSF
OSTI Identifier:
1212937
Resource Type:
Journal Article
Journal Name:
J. Electroceram.
Additional Journal Information:
Journal Volume: 34; Journal Issue: (2) ; 05, 2015
Country of Publication:
United States
Language:
ENGLISH

Citation Formats

Proffit, Diana E., Philippe, Thomas, Emery, Jonathan D., Ma, Qing, Buchholz, Bruce D., Voorhees, Peter W., Bedzyk, Michael J., Chang, Robert P.H., Mason, Thomas O., and CNRS-UMR). Thermal stability of amorphous Zn-In-Sn-O films. United States: N. p., 2015. Web. doi:10.1007/s10832-014-9967-4.
Proffit, Diana E., Philippe, Thomas, Emery, Jonathan D., Ma, Qing, Buchholz, Bruce D., Voorhees, Peter W., Bedzyk, Michael J., Chang, Robert P.H., Mason, Thomas O., & CNRS-UMR). Thermal stability of amorphous Zn-In-Sn-O films. United States. doi:10.1007/s10832-014-9967-4.
Proffit, Diana E., Philippe, Thomas, Emery, Jonathan D., Ma, Qing, Buchholz, Bruce D., Voorhees, Peter W., Bedzyk, Michael J., Chang, Robert P.H., Mason, Thomas O., and CNRS-UMR). Tue . "Thermal stability of amorphous Zn-In-Sn-O films". United States. doi:10.1007/s10832-014-9967-4.
@article{osti_1212937,
title = {Thermal stability of amorphous Zn-In-Sn-O films},
author = {Proffit, Diana E. and Philippe, Thomas and Emery, Jonathan D. and Ma, Qing and Buchholz, Bruce D. and Voorhees, Peter W. and Bedzyk, Michael J. and Chang, Robert P.H. and Mason, Thomas O. and CNRS-UMR)},
abstractNote = {},
doi = {10.1007/s10832-014-9967-4},
journal = {J. Electroceram.},
number = (2) ; 05, 2015,
volume = 34,
place = {United States},
year = {2015},
month = {9}
}