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Title: Reconstruction of Intensity From Covered Samples

Abstract

The safe handling of activated samples requires containment and covering the sample to eliminate any potential for contamination. Subsequent characterization of the surface with x-rays ideally necessitates a thin film. While many films appear visually transparent, they are not necessarily x-ray transparent. Each film material has a unique beam attenuation and sometimes have amorphous peaks that can superimpose with those of the sample. To reconstruct the intensity of the underlying activated sample, the x-ray attenuation and signal due to the film needs to be removed from that of the sample. This requires the calculation of unique deconvolution parameters for the film. The development of a reconstruction procedure for a contained/covered sample is described.

Authors:
 [1];  [1];  [1];  [1];  [1]
  1. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). High Flux Isotope Reactor (HFIR); Multicharged Ion Research Facility (MIRF)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1212343
DOE Contract Number:
DE-AC05-00OR22725
Resource Type:
Conference
Resource Relation:
Conference: Denver X-ray Conference, Big Sky, MT, USA, 20140728, 20140801
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY; 38 RADIATION CHEMISTRY, RADIOCHEMISTRY, AND NUCLEAR CHEMISTRY; 97 MATHEMATICS AND COMPUTING; diffraction; absorption; intensity reconstruction

Citation Formats

Barabash, Rozaliya, Watkins, Thomas R, Meisner, Roberta Ann, Burchell, Timothy D, and Rosseel, Thomas M. Reconstruction of Intensity From Covered Samples. United States: N. p., 2015. Web.
Barabash, Rozaliya, Watkins, Thomas R, Meisner, Roberta Ann, Burchell, Timothy D, & Rosseel, Thomas M. Reconstruction of Intensity From Covered Samples. United States.
Barabash, Rozaliya, Watkins, Thomas R, Meisner, Roberta Ann, Burchell, Timothy D, and Rosseel, Thomas M. Thu . "Reconstruction of Intensity From Covered Samples". United States. doi:. https://www.osti.gov/servlets/purl/1212343.
@article{osti_1212343,
title = {Reconstruction of Intensity From Covered Samples},
author = {Barabash, Rozaliya and Watkins, Thomas R and Meisner, Roberta Ann and Burchell, Timothy D and Rosseel, Thomas M},
abstractNote = {The safe handling of activated samples requires containment and covering the sample to eliminate any potential for contamination. Subsequent characterization of the surface with x-rays ideally necessitates a thin film. While many films appear visually transparent, they are not necessarily x-ray transparent. Each film material has a unique beam attenuation and sometimes have amorphous peaks that can superimpose with those of the sample. To reconstruct the intensity of the underlying activated sample, the x-ray attenuation and signal due to the film needs to be removed from that of the sample. This requires the calculation of unique deconvolution parameters for the film. The development of a reconstruction procedure for a contained/covered sample is described.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Thu Jan 01 00:00:00 EST 2015},
month = {Thu Jan 01 00:00:00 EST 2015}
}

Conference:
Other availability
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