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Title: Three-dimensional [alpha] colony characterization and prior-[beta] grain reconstruction of a lamellar Ti-6Al-4V specimen using near-field high-energy X-ray diffraction microscopy

Authors:
; ; ;  [1];  [2]
  1. Glasgow
  2. (
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
Sponsoring Org.:
U.S. OFFICE OF NAVAL RESEARCH
OSTI Identifier:
1212195
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Crystallography (Online); Journal Volume: 48; Journal Issue: (4) ; 08, 2015
Country of Publication:
United States
Language:
ENGLISH

Citation Formats

Wielewski, E., Menasche, D. B., Callahan, P. G., Suter, R., and CM). Three-dimensional [alpha] colony characterization and prior-[beta] grain reconstruction of a lamellar Ti-6Al-4V specimen using near-field high-energy X-ray diffraction microscopy. United States: N. p., 2016. Web. doi:10.1107/S1600576715011139.
Wielewski, E., Menasche, D. B., Callahan, P. G., Suter, R., & CM). Three-dimensional [alpha] colony characterization and prior-[beta] grain reconstruction of a lamellar Ti-6Al-4V specimen using near-field high-energy X-ray diffraction microscopy. United States. doi:10.1107/S1600576715011139.
Wielewski, E., Menasche, D. B., Callahan, P. G., Suter, R., and CM). Wed . "Three-dimensional [alpha] colony characterization and prior-[beta] grain reconstruction of a lamellar Ti-6Al-4V specimen using near-field high-energy X-ray diffraction microscopy". United States. doi:10.1107/S1600576715011139.
@article{osti_1212195,
title = {Three-dimensional [alpha] colony characterization and prior-[beta] grain reconstruction of a lamellar Ti-6Al-4V specimen using near-field high-energy X-ray diffraction microscopy},
author = {Wielewski, E. and Menasche, D. B. and Callahan, P. G. and Suter, R. and CM)},
abstractNote = {},
doi = {10.1107/S1600576715011139},
journal = {Journal of Applied Crystallography (Online)},
number = (4) ; 08, 2015,
volume = 48,
place = {United States},
year = {Wed Jun 15 00:00:00 EDT 2016},
month = {Wed Jun 15 00:00:00 EDT 2016}
}
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  • High-energy diffraction microscopy (HEDM) constitutes a suite of combined X-ray characterization methods, which hold the unique advantage of illuminating the microstructure and micromechanical state of a material during concurrent in situ mechanical deformation. The data generated from HEDM experiments provides a heretofore unrealized opportunity to validate meso-scale modeling techniques, such as crystal plasticity finite element modeling (CPFEM), by explicitly testing the accuracy of these models at the length scales where the models predict their response. Combining HEDM methods with in situ loading under known and controlled boundary conditions represents a significant challenge, inspiring the recent development of a new high-precisionmore » rotation and axial motion system for simultaneously rotating and axially loading a sample. In this paper, we describe the initial HEDM dataset collected using this hardware on an alpha-titanium alloy (Ti-7Al) under in situ tensile deformation at the Advanced Photon Source, Argonne National Laboratory. We present both near-field HEDM data that maps out the grain morphology and intragranular crystallographic orientations and far-field HEDM data that provides the grain centroid, grain average crystallographic orientation, and grain average elastic strain tensor for each grain. Finally, we provide a finite element mesh that can be utilized to simulate deformation in the volume of this Ti-7Al specimen.« less