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Title: Three-dimensional [alpha] colony characterization and prior-[beta] grain reconstruction of a lamellar Ti-6Al-4V specimen using near-field high-energy X-ray diffraction microscopy

Authors:
; ; ;  [1];  [2]
  1. Glasgow
  2. (
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
Sponsoring Org.:
U.S. OFFICE OF NAVAL RESEARCH
OSTI Identifier:
1212195
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Crystallography (Online); Journal Volume: 48; Journal Issue: (4) ; 08, 2015
Country of Publication:
United States
Language:
ENGLISH

Citation Formats

Wielewski, E., Menasche, D. B., Callahan, P. G., Suter, R., and CM). Three-dimensional [alpha] colony characterization and prior-[beta] grain reconstruction of a lamellar Ti-6Al-4V specimen using near-field high-energy X-ray diffraction microscopy. United States: N. p., 2016. Web. doi:10.1107/S1600576715011139.
Wielewski, E., Menasche, D. B., Callahan, P. G., Suter, R., & CM). Three-dimensional [alpha] colony characterization and prior-[beta] grain reconstruction of a lamellar Ti-6Al-4V specimen using near-field high-energy X-ray diffraction microscopy. United States. doi:10.1107/S1600576715011139.
Wielewski, E., Menasche, D. B., Callahan, P. G., Suter, R., and CM). 2016. "Three-dimensional [alpha] colony characterization and prior-[beta] grain reconstruction of a lamellar Ti-6Al-4V specimen using near-field high-energy X-ray diffraction microscopy". United States. doi:10.1107/S1600576715011139.
@article{osti_1212195,
title = {Three-dimensional [alpha] colony characterization and prior-[beta] grain reconstruction of a lamellar Ti-6Al-4V specimen using near-field high-energy X-ray diffraction microscopy},
author = {Wielewski, E. and Menasche, D. B. and Callahan, P. G. and Suter, R. and CM)},
abstractNote = {},
doi = {10.1107/S1600576715011139},
journal = {Journal of Applied Crystallography (Online)},
number = (4) ; 08, 2015,
volume = 48,
place = {United States},
year = 2016,
month = 6
}
  • High-energy diffraction microscopy (HEDM) constitutes a suite of combined X-ray characterization methods, which hold the unique advantage of illuminating the microstructure and micromechanical state of a material during concurrent in situ mechanical deformation. The data generated from HEDM experiments provides a heretofore unrealized opportunity to validate meso-scale modeling techniques, such as crystal plasticity finite element modeling (CPFEM), by explicitly testing the accuracy of these models at the length scales where the models predict their response. Combining HEDM methods with in situ loading under known and controlled boundary conditions represents a significant challenge, inspiring the recent development of a new high-precisionmore » rotation and axial motion system for simultaneously rotating and axially loading a sample. In this paper, we describe the initial HEDM dataset collected using this hardware on an alpha-titanium alloy (Ti-7Al) under in situ tensile deformation at the Advanced Photon Source, Argonne National Laboratory. We present both near-field HEDM data that maps out the grain morphology and intragranular crystallographic orientations and far-field HEDM data that provides the grain centroid, grain average crystallographic orientation, and grain average elastic strain tensor for each grain. Finally, we provide a finite element mesh that can be utilized to simulate deformation in the volume of this Ti-7Al specimen. The dataset supporting this article is available in the National Institute of Standards and Technology (NIST) repository (http://hdl.handle.net/11256/599).« less
  • High-energy diffraction microscopy (HEDM) constitutes a suite of combined X-ray characterization methods, which hold the unique advantage of illuminating the microstructure and micromechanical state of a material during concurrent in situ mechanical deformation. The data generated from HEDM experiments provides a heretofore unrealized opportunity to validate meso-scale modeling techniques, such as crystal plasticity finite element modeling (CPFEM), by explicitly testing the accuracy of these models at the length scales where the models predict their response. Combining HEDM methods with in situ loading under known and controlled boundary conditions represents a significant challenge, inspiring the recent development of a new high-precisionmore » rotation and axial motion system for simultaneously rotating and axially loading a sample. In this paper, we describe the initial HEDM dataset collected using this hardware on an alpha-titanium alloy (Ti-7Al) under in situ tensile deformation at the Advanced Photon Source, Argonne National Laboratory. We present both near-field HEDM data that maps out the grain morphology and intragranular crystallographic orientations and far-field HEDM data that provides the grain centroid, grain average crystallographic orientation, and grain average elastic strain tensor for each grain. Finally, we provide a finite element mesh that can be utilized to simulate deformation in the volume of this Ti-7Al specimen.« less
  • A scanning three-dimensional X-ray diffraction (3DXRD) microscope apparatus with a high-energy microbeam was installed at the BL33XU Toyota beamline at SPring-8. The size of the 50 keV beam focused using Kirkpatrick-Baez mirrors was 1.3 μm wide and 1.6 μm high in full width at half maximum. The scanning 3DXRD method was tested for a cold-rolled carbon steel sheet sample. A three-dimensional orientation map with 37 {sup 3} voxels was obtained.
  • High-Energy Diffraction Microscopy (HEDM) is a 3-d x-ray characterization method that is uniquely suited to measuring the evolving micromechanical state and microstructure of polycrystalline materials during in situ processing. The near-field and far-field configurations provide complementary information; orientation maps computed from the near-field measurements provide grain morphologies, while the high angular resolution of the far-field measurements provide intergranular strain tensors. The ability to measure these data during deformation in situ makes HEDM an ideal tool for validating micro-mechanical deformation models that make their predictions at the scale of individual grains. Crystal Plasticity Finite Element Models (CPFEM) are one such classmore » of micro-mechanical models. While there have been extensive studies validating homogenized CPFEM response at a macroscopic level, a lack of detailed data measured at the level of the microstructure has hindered more stringent model validation efforts. We utilize an HEDM dataset from an alphatitanium alloy (Ti-7Al), collected at the Advanced Photon Source, Argonne National Laboratory, under in situ tensile deformation. The initial microstructure of the central slab of the gage section, measured via near-field HEDM, is used to inform a CPFEM model. The predicted intergranular stresses for 39 internal grains are then directly compared to data from 4 far-field measurements taken between ~4% and ~80% of the macroscopic yield strength. In conclusion, the intergranular stresses from the CPFEM model and far-field HEDM measurements up to incipient yield are shown to be in good agreement, and implications for application of such an integrated computational/experimental approach to phenomena such as fatigue and crack propagation is discussed.« less