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Title: High electrical conductivity in out of plane direction of electrodeposited Bi 2 Te 3 films

Journal Article · · AIP Advances
DOI:https://doi.org/10.1063/1.4928863· OSTI ID:1210110

The out of plane electrical conductivity of highly anisotropic Bi2Te3 films grown via electro-deposition process was determined using four probe current-voltage measurements performed on 4.6 - 7.2 μm thickness Bi2Te3 mesa structures with 80 - 120 μm diameters sandwiched between metallic film electrodes. A three-dimensional finite element model was used to predict the electric field distribution in the measured structures and take into account the non-uniform distribution of the current in the electrodes in the vicinity of the probes. The finite-element modeling shows that significant errors could arise in the measured film electrical conductivity if simpler one-dimensional models are employed. In conclusion, a high electrical conductivity of (3.2 ± 0.4) · 105S/m is reported along the out of plane direction for Bi2Te3 films highly oriented in the [1 1 0] direction.

Research Organization:
Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
Grant/Contract Number:
SC0001299
OSTI ID:
1210110
Alternate ID(s):
OSTI ID: 1420650; OSTI ID: 1459182
Journal Information:
AIP Advances, Journal Name: AIP Advances Vol. 5 Journal Issue: 8; ISSN 2158-3226
Publisher:
American Institute of PhysicsCopyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 12 works
Citation information provided by
Web of Science

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Figures / Tables (8)


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