High electrical conductivity in out of plane direction of electrodeposited Bi 2 Te 3 films
The out of plane electrical conductivity of highly anisotropic Bi2Te3 films grown via electro-deposition process was determined using four probe current-voltage measurements performed on 4.6 - 7.2 μm thickness Bi2Te3 mesa structures with 80 - 120 μm diameters sandwiched between metallic film electrodes. A three-dimensional finite element model was used to predict the electric field distribution in the measured structures and take into account the non-uniform distribution of the current in the electrodes in the vicinity of the probes. The finite-element modeling shows that significant errors could arise in the measured film electrical conductivity if simpler one-dimensional models are employed. In conclusion, a high electrical conductivity of (3.2 ± 0.4) · 105S/m is reported along the out of plane direction for Bi2Te3 films highly oriented in the [1 1 0] direction.
- Research Organization:
- Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- Grant/Contract Number:
- SC0001299
- OSTI ID:
- 1210110
- Alternate ID(s):
- OSTI ID: 1420650; OSTI ID: 1459182
- Journal Information:
- AIP Advances, Journal Name: AIP Advances Vol. 5 Journal Issue: 8; ISSN 2158-3226
- Publisher:
- American Institute of PhysicsCopyright Statement
- Country of Publication:
- United States
- Language:
- English
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