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Sparse sampling and reconstruction for electron and scanning probe microscope imaging

Patent ·
OSTI ID:1202317
; ; ; ;
Systems and methods for conducting electron or scanning probe microscopy are provided herein. In a general embodiment, the systems and methods for conducting electron or scanning probe microscopy with an undersampled data set include: driving an electron beam or probe to scan across a sample and visit a subset of pixel locations of the sample that are randomly or pseudo-randomly designated; determining actual pixel locations on the sample that are visited by the electron beam or probe; and processing data collected by detectors from the visits of the electron beam or probe at the actual pixel locations and recovering a reconstructed image of the sample.
Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC04-94AL85000
Assignee:
Sandia Corporation (Albuquerque, NM)
Patent Number(s):
9,093,249
Application Number:
14/482,754
OSTI ID:
1202317
Country of Publication:
United States
Language:
English

References (10)

Sparse imaging for fast electron microscopy conference February 2013
Stable recovery of sparse overcomplete representations in the presence of noise journal January 2006
A novel method for acquiring large-scale automated scanning electron microscope data: METHOD FOR ACQUIRING LARGE-SCALE AUTOMATED SEM DATA journal August 2011
Gigantic Montages with a Fully Automated FE-SEM (Serial Sections of a Mouse Brain Tissue) journal July 2010
Towards neural circuit reconstruction with volume electron microscopy techniques journal October 2006
Automating the Collection of Ultrathin Serial Sections for Large Volume TEM Reconstructions journal July 2006
Compressed Sensing and Electron Microscopy book January 2012
The restricted isometry property and its implications for compressed sensing journal May 2008
The Split Bregman Method for L1-Regularized Problems journal January 2009
Video rate Atomic Force Microscopy (AFM) imaging using compressive sensing
  • Song, Bo; Xi, Ning; Yang, Ruiguo
  • 2011 IEEE 11th International Conference on Nanotechnology (IEEE-NANO), 2011 11th IEEE International Conference on Nanotechnology https://doi.org/10.1109/nano.2011.6144587
conference August 2011

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