When will low-contrast features be visible in a STEM X-ray spectrum image?

Parish, Chad M.

doi:10.1017/S1431927615000215

Title: When will low-contrast features be visible in a STEM X-ray spectrum image?

Journal Article · Wed Apr 01 00:00:00 EDT 2015 · Microscopy and Microanalysis

DOI:https://doi.org/10.1017/S1431927615000215· OSTI ID:1193180

Parish, Chad M. ^[1]

Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Radiation Effects and Microstructural Analysis Group

When will a small or low-contrast feature, such as an embedded second-phase particle, be visible in a scanning transmission electron microscopy (STEM) X-ray map? This work illustrates a computationally inexpensive method to simulate X-ray maps and spectrum images (SIs), based upon the equations of X-ray generation and detection. To particularize the general procedure, an example of nanostructured ferritic alloy (NFA) containing nm-sized Y₂Ti₂O₇ embedded precipitates in ferritic stainless steel matrix is chosen. The proposed model produces physically appearing simulated SI data sets, which can either be reduced to X-ray dot maps or analyzed via multivariate statistical analysis. Comparison to NFA X-ray maps acquired using three different STEM instruments match the generated simulations quite well, despite the large number of simplifying assumptions used. A figure of merit of electron dose multiplied by X-ray collection solid angle is proposed to compare feature detectability from one data set (simulated or experimental) to another. The proposed method can scope experiments that are feasible under specific analysis conditions on a given microscope. As a result, future applications, such as spallation proton–neutron irradiations, core-shell nanoparticles, or dopants in polycrystalline photovoltaic solar cells, are proposed.

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Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)

Sponsoring Organization:: USDOE Office of Science (SC)

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 1193180

Journal Information:: Microscopy and Microanalysis, Vol. 21, Issue 03; ISSN 1431-9276

Publisher:: Microscopy Society of America (MSA)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 43 works

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