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Title: XFEL diffraction: Developing processing methods to optimize data quality

Abstract

Serial crystallography, using either femtosecond X-ray pulses from free-electron laser sources or short synchrotron-radiation exposures, has the potential to reveal metalloprotein structural details while minimizing damage processes. However, deriving a self-consistent set of Bragg intensities from numerous still-crystal exposures remains a difficult problem, with optimal protocols likely to be quite different from those well established for rotation photography. Here several data processing issues unique to serial crystallography are examined. It is found that the limiting resolution differs for each shot, an effect that is likely to be due to both the sample heterogeneity and pulse-to-pulse variation in experimental conditions. Shots with lower resolution limits produce lower-quality models for predicting Bragg spot positions during the integration step. Also, still shots by their nature record only partial measurements of the Bragg intensity. An approximate model that corrects to the full-spot equivalent (with the simplifying assumption that the X-rays are monochromatic) brings the distribution of intensities closer to that expected from an ideal crystal, and improves the sharpness of anomalous difference Fourier peaks indicating metal positions.

Authors:
 [1]
  1. Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
Publication Date:
Research Org.:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States), Linac Coherent Light Source
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1191483
Alternate Identifier(s):
OSTI ID: 1222936
Grant/Contract Number:  
AC02-05CH11231; AC03-76SF00515
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Journal of Synchrotron Radiation (Online)
Additional Journal Information:
Journal Volume: 22; Journal Issue: 2; Journal ID: ISSN 1600-5775
Publisher:
International Union of Crystallography
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; serial femtosecond crystallography; X-ray free-electron laser; partiality postrefinement; mosaicity

Citation Formats

Sauter, Nicholas K. XFEL diffraction: Developing processing methods to optimize data quality. United States: N. p., 2015. Web. doi:10.1107/S1600577514028203.
Sauter, Nicholas K. XFEL diffraction: Developing processing methods to optimize data quality. United States. doi:10.1107/S1600577514028203.
Sauter, Nicholas K. Thu . "XFEL diffraction: Developing processing methods to optimize data quality". United States. doi:10.1107/S1600577514028203. https://www.osti.gov/servlets/purl/1191483.
@article{osti_1191483,
title = {XFEL diffraction: Developing processing methods to optimize data quality},
author = {Sauter, Nicholas K.},
abstractNote = {Serial crystallography, using either femtosecond X-ray pulses from free-electron laser sources or short synchrotron-radiation exposures, has the potential to reveal metalloprotein structural details while minimizing damage processes. However, deriving a self-consistent set of Bragg intensities from numerous still-crystal exposures remains a difficult problem, with optimal protocols likely to be quite different from those well established for rotation photography. Here several data processing issues unique to serial crystallography are examined. It is found that the limiting resolution differs for each shot, an effect that is likely to be due to both the sample heterogeneity and pulse-to-pulse variation in experimental conditions. Shots with lower resolution limits produce lower-quality models for predicting Bragg spot positions during the integration step. Also, still shots by their nature record only partial measurements of the Bragg intensity. An approximate model that corrects to the full-spot equivalent (with the simplifying assumption that the X-rays are monochromatic) brings the distribution of intensities closer to that expected from an ideal crystal, and improves the sharpness of anomalous difference Fourier peaks indicating metal positions.},
doi = {10.1107/S1600577514028203},
journal = {Journal of Synchrotron Radiation (Online)},
issn = {1600-5775},
number = 2,
volume = 22,
place = {United States},
year = {2015},
month = {1}
}

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Cited by: 29 works
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