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Title: Magnetoresistance of Au films

Abstract

Measurement of the magnetoresistance (MR) of Au films as a function of temperature and film thickness reveals a strong dependence on grain size distribution and clear violation of the Kohler s rule. Using a model of random resistor network, we show that this result can be explained if the MR arises entirely from inhomogeneity due to grain boundary scattering and thermal activation of grain boundary atoms.

Authors:
 [1];  [1];  [1];  [2]
  1. Chinese Academy of Sciences (CAS), Beijing (China). Inst. of Physics
  2. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Publication Date:
Research Org.:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1185612
Alternate Identifier(s):
OSTI ID: 1226595
Grant/Contract Number:  
AC05-00OR22725
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 116; Journal Issue: 22; Journal ID: ISSN 0021-8979
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Zhang, D. L., Song, X. H., Zhang, X., and Zhang, Xiaoguang. Magnetoresistance of Au films. United States: N. p., 2014. Web. doi:10.1063/1.4903953.
Zhang, D. L., Song, X. H., Zhang, X., & Zhang, Xiaoguang. Magnetoresistance of Au films. United States. doi:10.1063/1.4903953.
Zhang, D. L., Song, X. H., Zhang, X., and Zhang, Xiaoguang. Wed . "Magnetoresistance of Au films". United States. doi:10.1063/1.4903953. https://www.osti.gov/servlets/purl/1185612.
@article{osti_1185612,
title = {Magnetoresistance of Au films},
author = {Zhang, D. L. and Song, X. H. and Zhang, X. and Zhang, Xiaoguang},
abstractNote = {Measurement of the magnetoresistance (MR) of Au films as a function of temperature and film thickness reveals a strong dependence on grain size distribution and clear violation of the Kohler s rule. Using a model of random resistor network, we show that this result can be explained if the MR arises entirely from inhomogeneity due to grain boundary scattering and thermal activation of grain boundary atoms.},
doi = {10.1063/1.4903953},
journal = {Journal of Applied Physics},
issn = {0021-8979},
number = 22,
volume = 116,
place = {United States},
year = {2014},
month = {12}
}

Journal Article:
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Works referenced in this record:

Percolation and Conduction
journal, October 1973