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Title: High-temperature strain cell for tomographic imaging

Abstract

This disclosure provides systems, methods, and apparatus related to the high temperature mechanical testing of materials. In one aspect, a method includes providing an apparatus. The apparatus may include a chamber. The chamber may comprise a top portion and a bottom portion, with the top portion and the bottom portion each joined to a window material. A first cooled fixture and a second cooled fixture may be mounted to the chamber and configured to hold the sample in the chamber. A plurality of heating lamps may be mounted to the chamber and positioned to heat the sample. The sample may be placed in the first and the second cooled fixtures. The sample may be heated to a specific temperature using the heating lamps. Radiation may be directed though the window material, the radiation thereafter interacting with the sample and exiting the chamber through the window material.

Inventors:
; ; ; ;
Publication Date:
Research Org.:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1184563
Patent Number(s):
9,057,681
Application Number:
14/081,948
Assignee:
The Regents of the University of California (Oakland, CA) LBNL
DOE Contract Number:  
AC02-05CH11231
Resource Type:
Patent
Resource Relation:
Patent File Date: 2013 Nov 15
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING; 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY

Citation Formats

MacDowell, Alastair A., Nasiatka, James, Haboub, Abdel, Ritchie, Robert O., and Bale, Hrishikesh A. High-temperature strain cell for tomographic imaging. United States: N. p., 2015. Web.
MacDowell, Alastair A., Nasiatka, James, Haboub, Abdel, Ritchie, Robert O., & Bale, Hrishikesh A. High-temperature strain cell for tomographic imaging. United States.
MacDowell, Alastair A., Nasiatka, James, Haboub, Abdel, Ritchie, Robert O., and Bale, Hrishikesh A. Tue . "High-temperature strain cell for tomographic imaging". United States. doi:. https://www.osti.gov/servlets/purl/1184563.
@article{osti_1184563,
title = {High-temperature strain cell for tomographic imaging},
author = {MacDowell, Alastair A. and Nasiatka, James and Haboub, Abdel and Ritchie, Robert O. and Bale, Hrishikesh A.},
abstractNote = {This disclosure provides systems, methods, and apparatus related to the high temperature mechanical testing of materials. In one aspect, a method includes providing an apparatus. The apparatus may include a chamber. The chamber may comprise a top portion and a bottom portion, with the top portion and the bottom portion each joined to a window material. A first cooled fixture and a second cooled fixture may be mounted to the chamber and configured to hold the sample in the chamber. A plurality of heating lamps may be mounted to the chamber and positioned to heat the sample. The sample may be placed in the first and the second cooled fixtures. The sample may be heated to a specific temperature using the heating lamps. Radiation may be directed though the window material, the radiation thereafter interacting with the sample and exiting the chamber through the window material.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Jun 16 00:00:00 EDT 2015},
month = {Tue Jun 16 00:00:00 EDT 2015}
}

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Works referenced in this record:

Nanoscale X-ray imaging
journal, December 2010


In situ X-ray tomography observation of inhomogeneous deformation in semi-solid aluminium alloys
journal, September 2009


Characterization of internal damage in a MMCp using X-ray synchrotron phase contrast microtomography
journal, March 1999